Results 121 to 130 of about 676 (179)
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The MTTF and Reliability Evaluation of a PLC System
Key Engineering Materials, 2004This paper presents the evaluation technique of the mean time to failure (MTTF) and reliability corresponding to a programmable logic controller (PLC) structures such as a single controller, a dual controller and a triple modular redundancy (TMR) controller. The failure and repair period of PLCs are surveyed, and the failure rate of each unit composing
Lee, GB, Han, ZD, Lee, JS
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Approximation of MTTF calculation of a non-stationary gamma wear process
International Journal of Systems Assurance Engineering and Management, 2011Gamma distribution is known as the most suitable distribution to model the monotonically increasing wear or deterioration. Examples of wear or deterioration can be found in many of the mechanical components, such as in wear of the bearings, corrosion or erosion wear of pump casings and impellers etc. The component wearing gradually can be considered to
Anil Rana, Ajit Kumar Verma
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Design of fault‐tolerant control for MTTF
International Journal of Robust and Nonlinear Control, 2008AbstractMean time to failure (MTTF) is an important reliability index of fault‐tolerant control systems, which is chosen as a design objective in this paper. However, it is usually evaluated from stochastic reliability models, and no analytical expression is available to relate MTTF to controller parameters.
Li, Hongbin, Zhao, Qing
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NOTE ON MTTF OF A PARALLEL SYSTEM
International Journal of Reliability, Quality and Safety Engineering, 2011A parallel system with n identical units is considered, and its mean time to system failure (MTTF) is obtained when the failure time is exponential. A simple asymptotic method of computing MTTF is proposed and its approximal values are compared with the exact MTTFs when the failure time has a Weibull distribution.
TOSHIO NAKAGAWA, WON YOUNG YUN
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Computing the Availability and MTTF of Shared Protection Systems
7th IEEE International Conference on Computer and Information Technology (CIT 2007), 2007In this paper we investigate the reliability of shared protection systems such as one for N (1:N) that can be applied to access network node devices. We describe the effectiveness of such a protection system in a quantitative manner. The mathematical analysis gives closed form solutions of the availability and MTTF (Mean Time to Failure) perceived by ...
Hirokazu Ozaki, Atsushi Kara
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The failure of MTTF in availability evaluation
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318), 2003In this paper, a truncated bathtub is proposed to model the failure rate of a product with perfect burn-in. We expose some counter-intuition observations, e.g., increasing the MTTF does not necessarily increase the average and instantaneous availability during the product's lifetime, and the average and instantaneous availability could be improved ...
null Hairong Sun, J.J. Han
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A simple Markovian method for MTTF calculation
Microelectronics Reliability, 1987Abstract The MTTF of a system design with constant failure and repair rates and with some forms of stand-by redundancy and switching is an important characteristic of the system. Commonly, calculation of the MTTF requires knowledge of the reliability function R(t), which is integrated to yield the MTTF.
A. Dubi, A. Goldfeld, D. Sasson
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MTTF Enhancement Power-C4 Bump Placement Optimization
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2019Constructing a reliable power delivery network (PDN) is increasingly challenging by further technology scaling. PDN suffers from long-term reliability threats such as electromigration (EM). EM results in permanent failures and directly affects chip lifetime and voltage stability. Loss of limited controlled collapse chip connection (C4) pads to EM makes
Somayeh Rahimipour +5 more
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Toward a BITE for real time MTTF estimation of capacitors
2010 IEEE Instrumentation & Measurement Technology Conference Proceedings, 2010The use of an equipment able to provide a real time diagnostic of a monitored device (BITE) allows to increase reliability and to decrease costs. BITE operates on the basis of a suitable life model of the considered device that must relate time to failure with past and present stresses.
ALBERTINI, ANDREA +4 more
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Computing Bounds of the MTTF for a Set of Markov Chains
2013We present an algorithm to find some upper and lower bounds of the Mean Time To Failure (MTTF) for a set of absorbing Discrete Time Markov Chains (DTMC). We first present a link between the MTTF of an absorbing chain and the steady-state distribution of an ergodic DTMC derived from the absorbing one.
Farah Aït-Salaht +2 more
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