Results 261 to 270 of about 31,612 (289)

Error analysis for Mueller matrix measurement

Journal of the Optical Society of America A, 2003
The linear errors of Mueller matrix measurements are formulated for misalignment, depolarization, and incorrect retardation of the polarimetric components. The measured errors of a Mueller matrix depend not only on the imperfections of the measuring system but also on the Mueller matrix itself.
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A Mueller matrix model of Haidinger's brushes

Ophthalmic and Physiological Optics, 2003
Abstract Stokes vectors and Mueller matrices are used to model the polarisation properties (birefringence, dichroism and depolarisation) of any optical system, in particular the human eye. An explanation of the form and behaviour of the entoptic phenomenon of Haidinger's brushes is derived that complements and expands upon a previous ...
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Mueller matrix description of scattering

Surface Roughness and Scattering, 1992
Scattering measurements of rough surfaces are usually made using linearly polarized light. There are four possibilities: ba = pp, sp, ps and ss, where a is the initial state of polarization and b is the final state. Such measurements may be adequate for determining the power spectral densities (PSDs) of smooth topographically rough surfaces, but they ...
E. L. Church, J. C. Stover
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Automated Mueller matrix ellipsometry

Optics Communications, 1976
Abstract The application of rotating-compensator ellipsometry (RCE) to measurements of the system Mueller matrix M of linear optical systems is reported. This technique extends a previously reported procedure for automated Jones matrix ellipsometry to include systems that depolarize light.
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Mueller Matrix Ellipsometry Revisited

SPIE Proceedings, 1987
The object of ellipsometry is to determine the complex ratio ρ (ρ=tanifi exp(i&) ) of the reflected or transmitted polarization state parameters. Ellipsometry has traditionally been used as a tool for measuring the optical constants (n,k) of a surface, or when given the optical constants of the substrate, to determine some property such as the ...
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Mueller Matrix Microscopy

2022
Hui Ma, Honghui He, Jessica C. Ramella-Roman   +2 more
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Mueller Matrix Imaging

2023
Oriol Arteaga, Subiao Bian
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Mueller matrix decomposition methods for tissue polarization tomography

Optics and Lasers in Engineering, 2021
Wanrong Gao
exaly  

Advanced Mueller matrix ellipsometry: Instrumentation and emerging applications

Science China Technological Sciences, 2022
Xiuguo Chen, Honggang Gu, Shiyuan Liu
exaly  

Mueller matrix spectroscopic ellipsometry

Advanced Optical Technologies, 2022
James N Hilfiker, Nina Hong, Stefan Schoeche   +2 more
exaly