Results 241 to 250 of about 31,612 (289)

Mueller matrix microscopy

SPIE Proceedings, 2013
We describe here Mueller matrix microscopy, an imaging technique for investigating the anisotropic properties of the refractive index in biological samples. Tissue properties probed by polarization are the anisotropic real and imaginary parts of the refractive index that modify the polarization. Physical Sciences Inc.
Mircea Mujat, R. Daniel Ferguson, Nicusor Iftimia   +2 more
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From a nondepolarizing Mueller matrix to a depolarizing Mueller matrix

Journal of the Optical Society of America A, 2014
The depolarizing properties of a generic Mueller matrix are synthesized from a corresponding nondepolarizing reference Mueller matrix, which is appropriately factorized and transformed by sequentially adjusting the values of three indices of polarimetric purity (IPP) [Opt. Commun.284, 38 (2011)OPCOB80030-4018].
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Parameterization of the Mueller matrix

Journal of the Optical Society of America A, 2016
A deterministic Mueller matrix (Mueller-Jones matrix) contains seven independent parameters. By writing the so-called coherence vector in parametric form, the Mueller matrix can also be written in parametric form, where the matrix elements automatically satisfy the known relationships between each other.
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Components of purity of a Mueller matrix

Journal of the Optical Society of America A, 2011
The degree of polarimetric purity of a Mueller matrix, also called "depolarization index" [Opt. Acta 33, 185 (1986)] is expressed as a quadratic average of two contributions of different nature. The contribution due to the polarizance and diattenuation properties is given by a unique parameter called "degree of polarizance," and the complementary ...
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Differential Mueller matrix of a depolarizing homogeneous medium and its relation to the Mueller matrix logarithm

Journal of the Optical Society of America A, 2015
The different z-dependence and non-commutativity of the two components of the differential Mueller matrix of a homogeneous depolarizing medium prevent its formal identification with the Mueller matrix logarithm. By using a classic linear differential equation expansion, we advance a procedure for the extraction of the elementary polarization properties,
Razvigor, Ossikovski, Antonello, De Martino   +1 more
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Mueller-matrix characterization of liquid crystals

Thin Solid Films, 2004
Abstract Generalized spectroscopic ellipsometry (g-SE) has been applied to many anisotropic materials. This measurement is based on the 2×2 Jones matrix sample representation, which is often sufficient. However, when the reflected or transmitted light becomes sufficiently depolarized, the Mueller-matrix (MM) representation may be required for ...
J. N. HILFIKER, C. M. HERZINGER, T. WAGNER, A. MARINO, G. DELGAIS, ABBATE, GIANCARLO   +5 more
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Measurement of the Mueller matrix for ocean water

Applied Optics, 1984
The normalized light scattering polarization matrix has been measured for ocean water using an electrooptic light scattering polarimeter. Measurements were done on samples from the Atlantic and Pacific Oceans and the Gulf of Mexico. The polarization effects in the matrices were found to have, in general, a form which is similar to polarization effects ...
K J, Voss, E S, Fry
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Mueller matrix roots depolarization parameters

Applied Optics, 2012
The Mueller matrix roots decomposition recently proposed by Chipman in [1] and its three associated families of depolarization (amplitude depolarization, phase depolarization, and diagonal depolarization) are explored. Degree of polarization maps are used to differentiate among the three families and demonstrate the unity between phase and diagonal ...
Hannah D, Noble, Stephen C, McClain, Russell A, Chipman   +2 more
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Optimization of a snapshot Mueller matrix polarimeter

Optics Letters, 2008
We report on the optimization of a snapshot Mueller matrix polarimeter performed by using singular-value decomposition. The snapshot technique relies on wavelength polarization coding by four wave plates. The statistical noise on Mueller components is minimized through adjustment of the thickness of each plate.
Paul, Lemaillet, Sylvain, Rivet, Bernard, Le Jeune   +2 more
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Mueller matrix analysis of infrared ellipsometry

Applied Optics, 1994
A Mueller analysis has been done of IR ellipsometry performed with imperfect optical components. Equations linking experimental and calculated Fourier coefficients have been derived and consistently solved. Correction routines for permittivity measurements are demonstrated and discussed with gold and SrTiO(3) as examples.
E, Wold, J, Bremer
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