Results 281 to 290 of about 2,472,889 (327)

Snapshot Mueller matrix spectropolarimetry

SPIE Proceedings, 2007
We present a snapshot technique for performing spectrally-resolved Mueller matrix polarimetry, based on channeled spectropolarimetry. After discussing the measurement theory in detail, we present a simulated measurement of a polymer achromatic retarder. Finally, we review some methods for modifying the technique to achieve improved performance.
Nathan Hagen, Eustace L. Dereniak
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Automated Mueller matrix ellipsometry

Optics Communications, 1976
Abstract The application of rotating-compensator ellipsometry (RCE) to measurements of the system Mueller matrix M of linear optical systems is reported. This technique extends a previously reported procedure for automated Jones matrix ellipsometry to include systems that depolarize light.
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Anisotropy coefficients of a Mueller matrix

Journal of the Optical Society of America A, 2011
Anisotropy coefficients α, β, and γ that describe the type and the relative amount of the three kinds of anisotropy generally present in a Mueller matrix are introduced. Their derivation, algebraic properties, and physical interpretation are discussed.
Arteaga, Oriol, Garcia-Caurel, Enric, Ossikovski, Razvigor   +2 more
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Mueller Matrix Ellipsometry Revisited

SPIE Proceedings, 1987
The object of ellipsometry is to determine the complex ratio ρ (ρ=tanifi exp(i&) ) of the reflected or transmitted polarization state parameters. Ellipsometry has traditionally been used as a tool for measuring the optical constants (n,k) of a surface, or when given the optical constants of the substrate, to determine some property such as the ...
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Mueller matrix analysis of infrared ellipsometry

Applied Optics, 1994
A Mueller analysis has been done of IR ellipsometry performed with imperfect optical components. Equations linking experimental and calculated Fourier coefficients have been derived and consistently solved. Correction routines for permittivity measurements are demonstrated and discussed with gold and SrTiO(3) as examples.
E, Wold, J, Bremer
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Mueller matrix imaging polarimetry

Optical Engineering, 1995
The design and operation of a Mueller matrix imaging polarimeter is presented. The instrument is configurable to make a wide variety of polarimetric measurements of optical systems and samples. In one configuration, it measures the polarization properties of a set of ray paths through a sample.
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Characterization of cervical tissue using Mueller matrix polarimetry

Lasers in Medical Science, 2023
S. Khan, Mehwish Qadir, Amna Abdalla Mohammed Khalid, Sumara Ashraf, Iftikhar Ahmad   +4 more
semanticscholar   +1 more source

Terahertz generalized Mueller-matrix ellipsometry

SPIE Proceedings, 2006
We report on the first successful generalized Mueller-matrix ellipsometry measurements in the THz-frequency domain using the high-brilliance THz synchrotron radiation source IRIS at the electron storage ring BESSY, Germany. Generalized Ellipsometry, which is known as a powerful tool for measurement of optical constants including anisotropy and which ...
T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, M. Schubert   +4 more
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Automated high-speed Mueller matrix scatterometer

Applied Optics, 1997
A new scatterometer-polarimeter is described. It measures the angular distribution of intensity and of the complete Mueller matrix of light scattered by rough surfaces and particle suspensions. The measurement time is 1 s/scattering angle in the present configuration but can be reduced to a few milliseconds with modified electronics.
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Designing partial Mueller matrix polarimeters

SPIE Proceedings, 2009
When using a MMP for a detection or identification task, a user considers certain elements of the Mueller matrix. The usual way of performing this task is to measure the full Mueller matrix and discard the unused elements. For polarimeter designs with speed, miniaturization, or other constraints it may be desirable to have a system with reduced ...
J. Scott Tyo, Sergio J. Johnson, Zhipeng Wang, Brian G. Hoover   +3 more
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