Results 11 to 20 of about 76,759 (221)

Characterisation of nanowire structures with scatterometric and ellipsometric measurements [PDF]

open access: yesEPJ Web of Conferences, 2022
Nanowire structures arranged in a hexagonal lattice are to be characterized in terms of their diameter, height and pitch. A scatterometer and an imaging Mueller matrix ellipsometer, which is a combination of a commercial Mueller matrix ellipsometer and a
Grundmann Jana   +2 more
doaj   +1 more source

Probing Dynamic Variation of Layered Microstructure Using Backscattering Polarization Imaging

open access: yesPhotonics, 2022
Polarization imaging can quantitatively probe the microscopic structure of biological tissues which can be complex and consist of layered structures. In this paper, we established a fast-backscattering Mueller matrix imaging system to characterize the ...
Tongjun Bu   +7 more
doaj   +1 more source

Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures

open access: yesFrontiers in Physics, 2022
Conventional spectroscopic ellipsometry is a powerful tool in optical metrology. However, when it comes to the characterization of non-periodic nanostructures or structured fields that are much smaller than the illumination spot size, it is not well ...
Tim Käseberg   +10 more
doaj   +1 more source

Characterization of the Mueller Matrix: Purity Space and Reflectance Imaging

open access: yesPhotonics, 2022
Depolarization has been found to be a useful contrast mechanism in biological and medical imaging. The Mueller matrix can be used to describe polarization effects of a depolarizing material. An historical review of relevant polarization algebra, measures
Colin J. R. Sheppard   +3 more
doaj   +1 more source

Analyzing the Influence of Imaging Resolution on Polarization Properties of Scattering Media Obtained From Mueller Matrix

open access: yesFrontiers in Chemistry, 2022
The Mueller matrix contains abundant micro- and even nanostructural information of media. Especially, it can be used as a powerful tool to characterize anisotropic structures quantitatively, such as the particle size, density, and orientation information
Conghui Shao   +16 more
doaj   +1 more source

A collinear reflection Mueller matrix microscope for backscattering Mueller matrix imaging

open access: yesOptics and Lasers in Engineering, 2020
Abstract We developed a collinear reflection Mueller matrix microscope by adding polarization state generator (PSG) and polarization state analyzer (PSA) into the illumination and detection optical paths of a commercial metallurgical microscope.
Zhenhua Chen   +3 more
openaire   +1 more source

To study the Mueller matrix polarimetry for the characterization of wood and Teflon flat samples

open access: yesResults in Optics, 2021
In our manuscript, we carry out the Mueller matrix polarimetry for the characterization of wood and polytetrafluoroethylene (PTFE) or Teflon flat samples.
Sidra Batool   +4 more
doaj   +1 more source

Snapshot retinal imaging Mueller matrix polarimeter [PDF]

open access: yesSPIE Proceedings, 2015
Early diagnosis of glaucoma, which is a leading cause for visual impairment, is critical for successful treatment. It has been shown that Imaging polarimetry has advantages in early detection of structural changes in the retina. Here, we theoretically and experimentally present a snapshot Mueller Matrix Polarimeter fundus camera, which has the ...
Yifan, Wang   +4 more
openaire   +2 more sources

Comparative Study of Modified Mueller Matrix Transformation and Polar Decomposition Parameters for Transmission and Backscattering Tissue Polarimetries

open access: yesApplied Sciences, 2021
Mueller matrix polarimetry is widely used in biomedical studies and applications, for it can provide abundant microstructural information about tissues.
Binguo Chen   +6 more
doaj   +1 more source

Error Analysis and Calibration Improvement of the Imaging Section in a Mueller Matrix Microscope

open access: yesApplied Sciences, 2020
Currently, there are various calibration methods available to reduce the errors caused by the polarizing section of a dual-rotating-retarder polarimeter.
Jiewei Yu, Xuemin Cheng, Maolin Li
doaj   +1 more source

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