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Nanomaterials, 2022 Apart from being the subject of this Special Issue, what is nanometrology [...]
Petr Klapetek
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Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties [PDF]
SensorsOne of the most advanced and versatile nanoscale diagnostic tools is atomic force microscopy. By enabling advanced imaging techniques, it allows us to determine various assets of a surface, including morphological, electrical, mechanical, magnetic, and ...
Andrzej Sikora +6 more
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Ethical Challenges in Nanometrology [PDF]
Communications - Scientific Letters of the University of Zilina, 2018 Nanometrology is an intrinsic and fast developing part of nanoscience. Given the huge diversity of nanostructures ranging from large molecules from about 10 atoms to structures from 105 atoms (particles of the size ≤ 100 nm), broader investigations in this area cannot be exactly scrutinized nor repeated by the existing capacities. This gave rise to the
Stefan Luby
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Hydrogen Nanometrology in Advanced Carbon Nanomaterial Electrodes
Nanomaterials, 2021 A comparative experimental study between advanced carbon nanostructured electrodes, in similar hydrogen uptake/desorption conditions, is investigated making use of the recent molecular beam-thermal desorption spectrometry.
Rui F M Lobo +2 more
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Through Silicon MEMS Inspection with a Near-Infrared Laser Scanning Setup [PDF]
SensorsThe inspection of encapsulated MEMS devices typically relies on destructive methods which compromise the structural integrity of samples. In this work, we present the concept and preliminary experimental validation of a laser scanning setup to non ...
Manuel J. L. F. Rodrigues +5 more
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Frequency Noise Properties of Lasers for Interferometry in Nanometrology
Sensors, 2013 In this contribution we focus on laser frequency noise properties and their influence on the interferometric displacement measurements. A setup for measurement of laser frequency noise is proposed and tested together with simultaneous measurement of ...
Jan Hrabina +2 more
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Wavelet-based information theory in quantitative assessment of AFM images’ quality [PDF]
Scientific ReportsThe quantitative assessment of the image quality produced by atomic force microscopy (AFM) is an ongoing and challenging task. In our study, we demonstrate Shannon’s application of information theory for measuring image quality.
Bartosz Czesław Pruchnik +2 more
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Precision Nanometrology: Laser Interferometer, Grating Interferometer and Time Grating Sensor [PDF]
SensorsXinghui Li, Can Cui, Li Xinghui
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Proceedings of the International School of Physics “Enrico Fermi”, 2013 Methods and protocols are described when using fluorescence metrology to determine the average nanoparticle (np) size in colloids in the range of 1-10 nm. The technique is based on determining the rotational correlation time of the np from the decay of fluorescence anisotropy of a dye that is electrostatically or covalently attached to the np as it ...
Birch, David J. S., Yip, Philip
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Nanometrology and its perspectives in environmental research [PDF]
Environmental Health and Toxicology, 2014 Objectives Rapid increase in engineered nanoparticles (ENPs) in many goods has raised significant concern about their environmental safety. Proper methodologies are therefore needed to conduct toxicity and exposure assessment of nanoparticles in the ...
Hyun-A Kim +3 more
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