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Nanomaterials, 2022 Apart from being the subject of this Special Issue, what is nanometrology [...]
Petr Klapetek
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Proceedings of the International School of Physics “Enrico Fermi”, 2013 Methods and protocols are described when using fluorescence metrology to determine the average nanoparticle (np) size in colloids in the range of 1-10 nm. The technique is based on determining the rotational correlation time of the np from the decay of fluorescence anisotropy of a dye that is electrostatically or covalently attached to the np as it ...
Birch, David J. S., Yip, Philip
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Nanometrology and its perspectives in environmental research [PDF]
Environmental Health and Toxicology, 2014 Objectives Rapid increase in engineered nanoparticles (ENPs) in many goods has raised significant concern about their environmental safety. Proper methodologies are therefore needed to conduct toxicity and exposure assessment of nanoparticles in the ...
Hyun-A Kim +3 more
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Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties [PDF]
SensorsOne of the most advanced and versatile nanoscale diagnostic tools is atomic force microscopy. By enabling advanced imaging techniques, it allows us to determine various assets of a surface, including morphological, electrical, mechanical, magnetic, and ...
Andrzej Sikora +6 more
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New design of operational MEMS bridges for measurements of properties of FEBID-based nanostructures [PDF]
Beilstein Journal of NanotechnologyFocused electron beam-induced deposition (FEBID) is a novel technique for the development of multimaterial nanostructures. More importantly, it is applicable to the fabrication of free-standing nanostructures.
Bartosz Pruchnik +8 more
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Hydrogen Nanometrology in Advanced Carbon Nanomaterial Electrodes
Nanomaterials, 2021 A comparative experimental study between advanced carbon nanostructured electrodes, in similar hydrogen uptake/desorption conditions, is investigated making use of the recent molecular beam-thermal desorption spectrometry.
Rui Lobo, Noe Alvarez, Vesselin Shanov
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Through Silicon MEMS Inspection with a Near-Infrared Laser Scanning Setup [PDF]
SensorsThe inspection of encapsulated MEMS devices typically relies on destructive methods which compromise the structural integrity of samples. In this work, we present the concept and preliminary experimental validation of a laser scanning setup to non ...
Manuel J. L. F. Rodrigues +5 more
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Frequency Noise Properties of Lasers for Interferometry in Nanometrology
Sensors, 2013 In this contribution we focus on laser frequency noise properties and their influence on the interferometric displacement measurements. A setup for measurement of laser frequency noise is proposed and tested together with simultaneous measurement of ...
Ondřej Číp +3 more
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Wavelet-based information theory in quantitative assessment of AFM images’ quality [PDF]
Scientific ReportsThe quantitative assessment of the image quality produced by atomic force microscopy (AFM) is an ongoing and challenging task. In our study, we demonstrate Shannon’s application of information theory for measuring image quality.
Bartosz Czesław Pruchnik +2 more
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Applied Sciences, 2021 Attempts are made in this paper to improve the quality of the stitching between adjacent arc-profiles in the stitching linear-scan method for the roundness measurement of a cylinder in a small dimension.
Qiaolin Li +5 more
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