Results 91 to 100 of about 4,233 (222)
Angular-momentum nanometrology in an ultrathin plasmonic topological insulator film
Nature Communications, 2018 Complementary metal–oxide–semiconductor (CMOS) technology has provided a highly sensitive detection platform for high-resolution optical imaging, sensing and metrology.
Z. Yue +4 more
semanticscholar +1 more source
Chirality Detection in Scanning Tunneling Microscopy Data Using Artificial Intelligence
Small Methods, Volume 8, Issue 12, December 19, 2024.The lack of available annotated Scanning Probe Microscopy (SPM) data limits the applicability of Machine Learning to evaluate images on the nanoscale, requiring laborious manual work. The use of synthetic data to train state‐of‐the‐art object detection models can overcome this limitation, enabling a fast, accurate, and reliable analysis of SPM images ...
Tim J. Seifert +7 more
wiley +1 more source
Полирование монокристаллических материалов для оптоэлектронной техники [PDF]
, 2015 В результате исследования закономерностей полирования плоских поверхностей оптико-электронных элементов из монокристаллического карбида кремния и сапфира показано, что в качестве критериев эффективности полирования целесообразно использовать энергию ...
Ветров, А. Г. +6 more
core
Integrated nano-opto-electro-mechanical sensor for spectrometry and nanometrology
Nature Communications, 2017 Spectrometry is widely used for the characterization of materials, tissues, and gases, and the need for size and cost scaling is driving the development of mini and microspectrometers.
Ž. Zobenica +11 more
semanticscholar +1 more source
Advanced Materials, Volume 36, Issue 45, November 7, 2024.The research landscape comprising industry, academe, and government identified a critical path to accelerate the Green Transition far beyond slow conventional research through Digital Technologies that harness Artificial Intelligence, Smart Automation and High Performance Computing through Materials Acceleration Platforms, MAPs.
Simon P. Stier +34 more
wiley +1 more source
ChemCatChem, Volume 16, Issue 20, October 21, 2024.Efficiency of photo‐processes on semiconductor surfaces is typically measured under continuous irradiation of the catalyst; this can lead to determined limitations given by the substrate‐catalyst interaction. In this short review, we highlight the strengths and the weaknesses of several published studies on pollutants abatement and hydrogen production ...
Ettore Bianco +4 more
wiley +1 more source
Proceedings, 2018 Pinhole‐shaped light‐emitting diode (LED) arrays with dimension ranging from 100 μm down to 5 μm have been developed as point illumination sources. The proposed microLED arrays, which are based on gallium nitride (GaN) technology and emitting in the blue
Shinta Mariana +7 more
doaj +1 more source
Source shot noise mitigation in scanned beam microscopy [PDF]
, 2018 Accepted ...
Berggren, Karl K. +3 more
core
Metrology of EUV Masks by EUV-Scatterometry and Finite Element Analysis
, 2010 Extreme ultraviolet (EUV) lithography is seen as a main candidate for production of future generation computer technology. Due to the short wavelength of EUV light (around 13 nm) novel reflective masks have to be used in the production process.
Burger, S. +5 more
core +1 more source
Solar Cells on Multicrystalline Silicon Thin Films Converted from Low‐Cost Soda‐Lime Glass
Advanced Materials Interfaces, Volume 11, Issue 28, October 4, 2024.Multicrystalline silicon thin films from synthesized low‐cost soda‐lime glass (SLG) using aluminothermic reduction at 600 – 650 °C show moderate p‐type doping of ≈1 × 1017 cm−3. Heterojunction solar cells exhibit an open‐circuit voltage of 426 mV, a short‐circuit current density of 7.29 mA cm−2, a fill factor of 52.3%, and a conversion efficiency of 1 ...
Ingrid Schall +10 more
wiley +1 more source