Results 71 to 80 of about 1,529 (201)

Real-Time Frequency Tracking of an Electro-Thermal Piezoresistive Cantilever Resonator with ZnO Nanorods for Chemical Sensing

Chemosensors, 2019
The asymmetric resonance response in electro-thermal piezoresistive cantilever resonators causes a need of an optimization treatment for taking parasitic actuation-sensing effects into account.
Andi Setiono, Jiushuai Xu, Michael Fahrbach, Maik Bertke, Wilson Ombati Nyang’au, Hutomo Suryo Wasisto, Erwin Peiner   +6 more
doaj   +1 more source

Determination Accuracy of Measurement in Nanometrology [PDF]

, 2019
The presented doctoral thesis deals with measurements of extremely small sizes in nanometrology using a touch probe, which constitutes a part of a three-coordinate measuring system.
Šrámek, Jan
core  

Microscopic Acid‐Induced Degradation and Elemental Release From Thermoformed and 3D‐Printed Orthodontic Aligners in a Simulated Gastric Environment

Journal of Biomedical Materials Research Part B: Applied Biomaterials, Volume 113, Issue 10, October 2025.
ABSTRACT Clear aligners have revolutionized orthodontic treatment, yet concerns are rising about microplastics (MPs) and nanoplastics (NPs) released from these devices through mechanical wear and chemical degradation. Once ingested, these particles may undergo structural and chemical transformations in the gastrointestinal tract, particularly under ...
Piero Antonio Zecca, Eleonora Ivonne Scurati, Francesca Zara, Mario Raspanti, Niccolò Baranzini, Gilberto Binda, Marco Serafin, Alberto Caprioglio, Marina Borgese   +8 more
wiley   +1 more source

Computational nanometrology of nanostructures: the challenge of spatial complexity [PDF]

, 2017
Several applications of nanotechnology are based on the surface nanopatterning of materials and the new functionalities it brings about. Not surprisingly, the novel material properties are tightly linked to nanostructure morphology and very sensitive to ...
Kostas Poulios, Manolis Chatzigeorgiou, Vassilios Constantoudis, George Papavieros   +3 more
core   +1 more source

Supramolecular host–guest self-assembled monolayers as a new generation of nanoscale ruler under the reform of SI units

Nano Research
Si lattice-based linewidth, as the most used calibrator in the semiconductor industry, failed to meet the nanoscale demands of critical dimensions (CD).
Jianqiao Li, Yufei Zhang, Yushu Shi, Ke Deng, Qingdao Zeng   +4 more
doaj   +1 more source

Time‐Resolved Cathodoluminescence Spectroscopy of Oxygen‐Related Defects in AlN Layers

physica status solidi (b), Volume 262, Issue 10, October 2025.
High‐temperature annealing significantly improves the crystal quality of sputter‐deposited AlN templates, but at the same time introduces oxygen‐related defects. Their origin is investigated using time‐resolved cathodoluminescence spectroscopy. Furthermore, these defects impact the deep‐UV transparency of the AlN templates.
Barbara Szafranski, Lukas Peters, Christoph Margenfeld, Stefan Wolter, Andreas Waag, Tobias Voss   +5 more
wiley   +1 more source

Interferometric coordinates measurement sytem for local probe microscopy nanometrology [PDF]

, 2014
We present an overview of new approaches to the design of nanometrology measuring system with a focus on methodology of nanometrology interferometric techniques and associated problems.
Hrabina, Jan
core  

Multiscale Fabrication and Characterization of a NEMS Force Sensor

Advanced Materials Technologies, Volume 10, Issue 4, February 19, 2025.
Fabricated silicon nanowires integrated with MEMS shuttle on a silicon‐on‐insulator wafer using novel fabrication technology enable the device to detect subtle multi‐axis forces. Gage factor tests show static manipulation response, while dynamic analysis indicates robustness and high resonant frequency.
Masoud Jedari Ghourichaei, Umut Kerimzade, Levent Demirkazik, Bartosz Pruchnik, Krzysztof Kwoka, Dominik Badura, Tomasz Piasecki, Alp Timucin Toymus, Onur Aydin, Bekir Aksoy, Cemal Aydogan, Gokhan Nadar, Ivo W. Rangelow, Levent Beker, Arda Deniz Yalcinkaya, Halil Bayraktar, Teodor Gotszalk, Burhanettin Erdem Alaca   +17 more
wiley   +1 more source

Shot-noise limited throughput of soft X-ray ptychography for nanometrology applications [PDF]

, 2018
Due to its potential for high resolution and three-dimensional imaging, soft X-ray ptychography has received interest for nanometrology applications.
Stefan M. Bäumer, Florijn, Bastiaan, Bäumer, Stefan MB, Rik Kruidhof, Wouter D. Koek, Sadeghian Marnani, H, Hamed Sadeghian, Bäumer, Stefan, Sadeghian, Hamed, Bastiaan Florijn, Kruidhof, Rik, Koek, Wouter   +11 more
core   +1 more source

Monte Carlo method in optical atomic force microscopy

Journal of Measurement Science and Instrumentation, 2021
Scanning probe microscopy（SPM） is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. Atomic force microscopy is one of the SPM family which is considered as a very versatile tool for surface imaging and ...
doaj