Results 61 to 70 of about 3,419 (196)

How to select the most relevant 3D roughness parameters of a surface [PDF]

, 2014
In order to conduct a comprehensive roughness analysis, around sixty 3D roughness parameters are created to describe most of the surface morphology with regard to specific functions, properties or applications.
ASME B46.1, Berglund, Bigerelle, Bigerelle, Efron, Hall, Huart, Jordan, Montmitonnet, Mougin, Najjar, Najjar, Narayan, Scott, Stachowiak, Stout, Van Gorp, Whitehouse, Whitehouse, Wilson, Yang   +20 more
core   +2 more sources

Analytical and Electrochemical Characterization of Mechanochemically Recovered Graphite from Spent Lithium‐Ion Batteries for Anode Additive Applications

Advanced Sustainable Systems, Volume 10, Issue 2, February 2026.
We introduce a new, energy efficient chemical treatment to recover graphite from Li‐ion battery waste. The graphite recovered this way can be re‐introduced in shares up to 50% in new anodes without neither capacity loss nor increased aging effects compared to “fresh” graphite.
Slaheddine Jabri, Anna Rollin, Sukanya Sukanya, Alma Blumberg, Mara Hiller, René Wilhelm, Michael Kurrat, Petr Novák, Markus Etzkorn, Uta Schlickum   +9 more
wiley   +1 more source

Cathodoluminescence hyperspectral imaging on the nanometre scale [PDF]

, 2011
Extending cathodoluminescence microscopy into the hyperspectral imaging mode brings significant benefits to an already powerful nano-scale characterization tool.
Edwards, Paul, Krishnan Jagadamma, Lethy, Martin, Robert, Wark, Alastair   +3 more
core  

Reactive Atom Plasma (RAP) figuring machine for meter class optical surfaces [PDF]

, 2013
A new surface figuring machine called Helios 1200 is presented in this paper. It is designed for the figuring of meter sized optical surfaces with form accuracy correction capability better than 20 nm rms within a reduced number of iterations.
Castelli, Marco, Jourdain, Renaud, Proscia, David, Shore, Paul, Sommer, P.   +4 more
core   +1 more source

Refractive Index Compensation in Over-Determined Interferometric Systems

Sensors, 2012
We present an interferometric technique based on a differential interferometry setup for measurement under atmospheric conditions. The key limiting factor in any interferometric dimensional measurement are fluctuations of the refractive index of air ...
Zdeněk Buchta, Jan Hrabina, Martin Čížek, Ondřej Číp, Miroslava Holá, Josef Lazar   +5 more
doaj   +1 more source

High-Precision Cutting Edge Radius Measurement of Single Point Diamond Tools Using an Atomic Force Microscope and a Reverse Cutting Edge Artifact

Applied Sciences, 2020
This paper presents a measurement method for high-precision cutting edge radius of single point diamond tools using an atomic force microscope (AFM) and a reverse cutting edge artifact based on the edge reversal method.
Kai Zhang, Yindi Cai, Yuki Shimizu, Hiraku Matsukuma, Wei Gao   +4 more
doaj   +1 more source

Intelligent sampling for the measurement of structured surfaces [PDF]

, 2012
Uniform sampling in metrology has known drawbacks such as coherent spectral aliasing and a lack of efficiency in terms of measuring time and data storage.
, , , Barker R M, Blunt L, J Wang, L A Blunt, Leach R, Li M, P J Scott, Petkovski M Bogdanova S Bogdanov M, Pharr M, R K Leach, Remondino F, Stout K J, The MathWorks, Thompson S K, Verma R, Wang J, Whitehouse D J, X Jiang, Zhang X   +21 more
core   +1 more source

Impact of substrate curvature on grazing‐incidence small‐angle X‐ray scattering signal: theory and example of Ag thin‐film growth

Journal of Applied Crystallography, Volume 59, Issue 1, Page 93-107, February 2026.
The paper formally addresses the influence of the substrate curvature and size on the grazing‐incidence small‐angle X‐ray scattering (GISAXS) signal. Using the established theory, GISAXS can be combined with substrate‐curvature‐based stress measurements, which is demonstrated on the example of Ag thin‐film growth.Grazing‐incidence small‐angle X‐ray ...
Michał Kamiński, Bärbel Krause, Gregory Abadias, Alessandro Coati, Yves Garreau, Anny Michel, Andrea Resta, Karan Solanki, Alina Vlad, David Babonneau   +9 more
wiley   +1 more source

Enhanced Data-Processing Algorithms for Dispersive Interferometry Using a Femtosecond Laser

Sensors
Dispersive interferometry based on a femtosecond laser is extensively utilized for achieving absolute distance measurements with high accuracy. However, this method cannot measure arbitrary distances without encountering a dead zone, and deviations in ...
Tao Liu, Hiraku Matsukuma, Amane Suzuki, Ryo Sato, Wei Gao   +4 more
doaj   +1 more source

Approach to measurements at the nano level, with an emphasis on biomedicine

Medisur, 2023
This article aims to alert about the relevance of nanosciences and nanotechnology accompanied by nanometrology for the nations development in the 21st century.
Ernesto José López González, Yolanda Cabrera Macías, Tatiana de las Mercedes Escoriza Martínez, Marle Pérez de Armas, Ernesto López Cabrera   +4 more
doaj