Results 51 to 60 of about 1,529 (201)
Nanometrology using time-resolved fluorescence techniques [PDF]
This thesis looks at fluorescence techniques and their use for nanometrology applications. It has been primarily industrially linked with scientific instrument vendors Horiba Scientific IBH and Horiba Scientific ISA and examines the state of the art ...
Yip, Philip
core +2 more sources
Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures
Conventional spectroscopic ellipsometry is a powerful tool in optical metrology. However, when it comes to the characterization of non-periodic nanostructures or structured fields that are much smaller than the illumination spot size, it is not well ...
Tim Käseberg +10 more
doaj +1 more source
This study presents a synthesis method for lanthanide‐doped NaGdF4 particles in an aqueous environment. Clearly distinct cathodoluminescence (CL) spectra were observed for europium‐ and thulium‐doped nanoparticles, stable for up to 100 s of excitation time.
Jörgen Jungclaus +5 more
wiley +1 more source
Enhanced Data-Processing Algorithms for Dispersive Interferometry Using a Femtosecond Laser
Dispersive interferometry based on a femtosecond laser is extensively utilized for achieving absolute distance measurements with high accuracy. However, this method cannot measure arbitrary distances without encountering a dead zone, and deviations in ...
Tao Liu +4 more
doaj +1 more source
We introduce a new, energy efficient chemical treatment to recover graphite from Li‐ion battery waste. The graphite recovered this way can be re‐introduced in shares up to 50% in new anodes without neither capacity loss nor increased aging effects compared to “fresh” graphite.
Slaheddine Jabri +9 more
wiley +1 more source
Introductory Guide to Nanometrology [PDF]
This Guide introduces the reader to the science of measurements at the nanoscale, that is nanometrology. It is aimed at researchers in the nanotechnology area, for whom the metrology aspect is new, and at metrologists, interested in knowing about the ...
HANSEN Poul-Erik +25 more
core
Refractive Index Compensation in Over-Determined Interferometric Systems
We present an interferometric technique based on a differential interferometry setup for measurement under atmospheric conditions. The key limiting factor in any interferometric dimensional measurement are fluctuations of the refractive index of air ...
Zdeněk Buchta +5 more
doaj +1 more source
The paper formally addresses the influence of the substrate curvature and size on the grazing‐incidence small‐angle X‐ray scattering (GISAXS) signal. Using the established theory, GISAXS can be combined with substrate‐curvature‐based stress measurements, which is demonstrated on the example of Ag thin‐film growth.Grazing‐incidence small‐angle X‐ray ...
Michał Kamiński +9 more
wiley +1 more source
Spectrally resolved interferometry utilizing a femtosecond laser is widely employed for absolute distance measurement. However, deviations in the output time pulse of the conventional algorithm through inverse Fourier transform are inevitable. Herein, an
Tao Liu +4 more
doaj +1 more source
This paper presents a measurement method for high-precision cutting edge radius of single point diamond tools using an atomic force microscope (AFM) and a reverse cutting edge artifact based on the edge reversal method.
Kai Zhang +4 more
doaj +1 more source

