Results 91 to 100 of about 3,419 (196)

Optimal Design of Electromagnetically Actuated MEMS Cantilevers

Sensors, 2018
In this paper we present the numerical and experimental results of a design optimization of electromagnetic cantilevers. In particular, a cost-effective technique of evolutionary computing enabling the simultaneous minimization of multiple criteria is ...
Paolo Di Barba, Teodor Gotszalk, Wojciech Majstrzyk, Maria Evelina Mognaschi, Karolina Orłowska, Sławomir Wiak, Andrzej Sierakowski   +6 more
doaj   +1 more source

Полирование монокристаллических материалов для оптоэлектронной техники [PDF]

, 2015
В результате исследования закономерностей полирования плоских поверхностей оптико-электронных элементов из монокристаллического карбида кремния и сапфира показано, что в качестве критериев эффективности полирования целесообразно использовать энергию ...
Ветров, А. Г., Данильченко, М. А., Ковалев, С. В., Сидорко, В. И., Сильченко, Я. Л., Филатов, А. Ю., Филатов, Ю. Д.   +6 more
core  

Biomimetic and biodegradable cellulose acetate scaffolds loaded with dexamethasone for bone implants

Beilstein Journal of Nanotechnology, 2018
There is, as a matter of fact, an ever increasing number of patients requiring total hip replacement (Pabinger, C.; Geissler, A. Osteoarthritis Cartilage 2014, 22, 734–741).
Aikaterini-Rafailia Tsiapla, Varvara Karagkiozaki, Veroniki Bakola, Foteini Pappa, Panagiota Gkertsiou, Eleni Pavlidou, Stergios Logothetidis   +6 more
doaj   +1 more source

Suppression of Air Refractive Index Variations in High-Resolution Interferometry

Sensors, 2011
The influence of the refractive index of air has proven to be a major problem on the road to improvement of the uncertainty in interferometric displacement measurements.
Zdeněk Buchta, Jan Hrabina, Martin Čížek, Ondřej Číp, Josef Lazar   +4 more
doaj   +1 more source

Multi-functional MEMS/NEMS for nanometrology applications

2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013), 2013
As micro- and nano-electromechanical systems (M/NEMS) enter more widely into sensing applications and precision nanometrology it is timely to consider the advantages to be gained from a excitation and readout system which may be tailored for a wide range of applications.
Hao, L, Gallop, J, Stewart, M, Lees, K, Chen, J   +4 more
openaire   +2 more sources

Retos de las mediciones en la nanoescala [PDF]

, 2013
Se describen los fenómenos que ocurren en las nanodimensiones y la importancia de la Nanometrología para resolver problemas de la sociedad actual. También, se ponen de manifiesto los retos presentes y futuros que tiene la Nanometrología.
Herrera-Basurto, Raúl, Simonet, B.M., Valcárcel, M.   +2 more
core  

Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy

Sensors, 2014
We present a design of a nanometrology measuring setup which is a part of the national standard instrumentation for nanometrology operated by the Czech Metrology Institute (CMI) in Brno, Czech Republic.
Josef Lazar, Petr Klapetek, Miroslav Valtr, Jan Hrabina, Zdenek Buchta, Onrej Cip, Martin Cizek, Jindrich Oulehla, Mojmir Sery   +8 more
doaj   +1 more source

Imaging interference microscope for nanometrology

ACTA IMEKO, 2014
Here we report the development of the primary nanometrology capacity at the National Metrology Institute of Brazil (INMETRO). An interference microscope of the Linnik type has been developed and subjected to optimization and characterization studies. The recording of the fringes is done by an automated CCD system with 2 possible processing approaches ...
Igor Malinovsky, Iakyra B. Couceiro, Ricardo Santos Franca,  Mauricio S. Lima, Carlos L. S. Azeredo, Clara M. S. Almeida, Jean P. Von der Weid   +6 more
openaire   +1 more source

Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry

Measurement Science Review, 2015
We report on investigations of how fast changes of the refractive index influence the uncertainty of interferometric displacement measurements. Measurement of position within a limited range is typical for precise positioning of coordinate measuring ...
Holá Miroslava, Hrabina Jan, Sarbort Martin, Oulehla Jindrich, Cíp Ondrej, Lazar Josef   +5 more
doaj   +1 more source

Editor for Asia-Pacific [PDF]

This journal and the individual contributions in it are protected under copyright by IFSA Publishing, and the following terms and conditions apply to their use: Photocopying: Single photocopies of single articles may be made for personal use as allowed ...
For Asia, George M
core