Results 111 to 120 of about 4,233 (222)

Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy

Sensors, 2014
We present a design of a nanometrology measuring setup which is a part of the national standard instrumentation for nanometrology operated by the Czech Metrology Institute (CMI) in Brno, Czech Republic.
Josef Lazar, Petr Klapetek, Miroslav Valtr, Jan Hrabina, Zdenek Buchta, Onrej Cip, Martin Cizek, Jindrich Oulehla, Mojmir Sery   +8 more
doaj   +1 more source

Imaging interference microscope for nanometrology

ACTA IMEKO, 2014
Here we report the development of the primary nanometrology capacity at the National Metrology Institute of Brazil (INMETRO). An interference microscope of the Linnik type has been developed and subjected to optimization and characterization studies. The recording of the fringes is done by an automated CCD system with 2 possible processing approaches ...
Igor Malinovsky, Iakyra B. Couceiro, Ricardo Santos Franca,  Mauricio S. Lima, Carlos L. S. Azeredo, Clara M. S. Almeida, Jean P. Von der Weid   +6 more
openaire   +1 more source

Editor for Asia-Pacific [PDF]

This journal and the individual contributions in it are protected under copyright by IFSA Publishing, and the following terms and conditions apply to their use: Photocopying: Single photocopies of single articles may be made for personal use as allowed ...
For Asia, George M
core  

Studying carbonisation with raman spectroscopy [PDF]

, 2013
Raman spectroscopy can provide fast and non-destructive analysis of carbonaceous materials. As it is able to detect nanometre-sized structural features, Raman spectroscopy is widely used in the study of carbon nanotubes, fullerenes, graphenes, and many ...
Manley-Harris, Merilyn, McDonald-Wharry, John, Pickering, Kim L., Ripberger, Georg   +3 more
core  

Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry

Measurement Science Review, 2015
We report on investigations of how fast changes of the refractive index influence the uncertainty of interferometric displacement measurements. Measurement of position within a limited range is typical for precise positioning of coordinate measuring ...
Holá Miroslava, Hrabina Jan, Sarbort Martin, Oulehla Jindrich, Cíp Ondrej, Lazar Josef   +5 more
doaj   +1 more source

Superoscillatory nanometrology

, 2019
Superoscillatory field created by Pancharatnam-Berry phase metasurface contains structured elements with orders of magnitude smaller than the wavelength of light. It is used as “optical ruler” for nanoscale diaplacement metrology with resolution of 2.3 nm.
Yuan, Guanghui, Zheludev, Nikolai
openaire   +1 more source

Assessing implications of nanoplastics exposure to plants with advanced nanometrology techniques.

Journal of Hazardous Materials, 2022
Ana Elena Pradas Del Real, D. Mitrano, H. Castillo-Michel, Mohammad Wazne, J. Reyes-Herrera, Emely Bortel, B. Hesse, J. Villanova, G. Sarret   +8 more
semanticscholar   +1 more source

Control of inter-particle distance between nanoparticles using DNA origami [PDF]

BIO Web of Conferences
Guckel Jannik, Park Daesung, Etzkorn Markus, Liu Zhe, Wang Zunhao, Lalkens Birka   +5 more
doaj   +1 more source

Bioengineering of hybrid nanomaterials based on non-stoichiometric nanocrystalline hydroxyapatite and nanometrology of small carbonate content in their structure

Results in Engineering, 2023
P. Seredin, D. Goloshchapov, N. S. Buylov, V. Kashkarov, A. A. Emelyanova, K. Eremeev, Y. Ippolitov   +6 more
semanticscholar   +1 more source

D6.1 - Multiplexing interferometers to provide novel capabilities for nanometrology

Lectures, 2023
T. Kissinger
semanticscholar   +1 more source