Results 21 to 30 of about 4,233 (222)
Semiconductor Multilayer Nanometrology with Machine Learning
Nanomanufacturing and Metrology, 2023 This paper covers various measurement methods and algorithms to detect the thickness of semiconductor multilayer devices. Model-based algorithm is suitable for cases where the number of layers is small or physical interpretation is required.
Hyunsoo Kwak, Jungwon Kim
semanticscholar +1 more source
Promising solutions for automating measurement methods in nanometric range
Технічна інженерія, 2021 The article notes that nanometrology is an integral component of nanofabrication, and the global nanomaterials market is actively developing and its capacity in 2019 is estimated at $8.5 billion.
V.Ya. Pavlenko +3 more
doaj +1 more source
Room-Temperature Multiferroic Liquids: Ferroelectric and Ferromagnetic Order in a Hybrid Nanoparticle-Liquid Crystal System. [PDF]
Adv MaterA hybrid fluid combining ferrimagnetic nanoplatelets and a ferroelectric nematic displays coexisting magnetization and polarisation at room temperature. This self‐assembled multiferroic shows strong magnetoelectric effect and nonlinear optical response, offering a soft, reconfigurable platform for next‐generation sensing, actuation, and photonic ...
Nádasi H +11 more
europepmc +2 more sources
Surface Acoustic Waves in Thin Films Nanometrology [PDF]
, 2015 Thin films nanometrology is an emerging field in nanoscience as the synthesis, processing and applications of nanostructured thin films require an in-depth knowledge of their elastic constants. The elastic energy of a surface acoustic wave propagating in
BETTUCCI, Andrea
core +1 more source
Operando surface optical nanometrology reveals diazonium salts' visible photografting mechanism.
Nanoscale, 2023 High resolution and quantitative surface modification through photografting is a highly desirable strategy towards the preparation of smart surfaces, enabling chemical functions to be precisely located onto specific regions of inert surfaces.
Baptiste Maillot +4 more
semanticscholar +1 more source
Applied Sciences, 2021 Major modifications are made to the setup and signal processing of the method of in-situ measurement of the pitch of a diffraction grating based on the angles of diffraction of the diffracted optical frequency comb laser emanated from the grating. In the
Dong Wook Shin +6 more
doaj +1 more source
Applied Sciences, 2020 This paper presents an off-axis differential method for the improvement of a femtosecond laser differential chromatic confocal probe having a dual-detector configuration.
Chong Chen +4 more
doaj +1 more source
Ultra-low thermal conductivity and acoustic dynamics of Si nanostructured metalattices probed using ultrafast high harmonic beams [PDF]
EPJ Web of Conferences, 2019 We extend optical nanometrology capabilities to smaller dimensions by using tabletop coherent extreme ultraviolet (EUV) beams. Specifically, we characterize thermal transport and acoustic wave propagation in 3D periodic silicon inverse metalattices with
Abad Begoña +17 more
doaj +1 more source
Traceable GISAXS measurements for pitch determination of a 25 nm self-assembled polymer grating [PDF]
, 2014 The feature sizes of only a few nanometers in modern nanotechnology and next-generation microelectronics continually increase the demand for suitable nanometrology tools. Grazing incidence small-angle X-ray scattering (GISAXS) is a versatile technique to
Hoell, Armin +5 more
core +3 more sources
Informatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska, 2016 The structure of Ukrainian metrology service, tasks of everyone its unit, basic stages of development and transformation of national legislation are considered on metrology tasks and harmonization of basic concepts and organizational structure of ...
Oleksandr1 Huk +2 more
doaj +1 more source