Results 31 to 40 of about 4,739 (252)
Nanometrology: Absolute Seebeck coefficient of individual silver nanowires [PDF]
Scientific Reports, 2019 Thermoelectric phenomena can be strongly modified in nanomaterials. The determination of the absolute Seebeck coefficient is a major challenge for metrology with respect to micro- and nanostructures due to the fact that the transport properties of the ...
M. Kockert +8 more
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Synthetic Data in Quantitative Scanning Probe Microscopy
Nanomaterials, 2021 Synthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts.
David Nečas, Petr Klapetek
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Angular-momentum nanometrology in an ultrathin plasmonic topological insulator film [PDF]
Nature Communications, 2018 Complementary metal–oxide–semiconductor (CMOS) technology has provided a highly sensitive detection platform for high-resolution optical imaging, sensing and metrology.
Zengji Yue +4 more
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Promising solutions for automating measurement methods in nanometric range
Технічна інженерія, 2021 The article notes that nanometrology is an integral component of nanofabrication, and the global nanomaterials market is actively developing and its capacity in 2019 is estimated at $8.5 billion.
V.Ya. Pavlenko +3 more
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Surface Acoustic Waves in Thin Films Nanometrology [PDF]
, 2015 Thin films nanometrology is an emerging field in nanoscience as the synthesis, processing and applications of nanostructured thin films require an in-depth knowledge of their elastic constants. The elastic energy of a surface acoustic wave propagating in
BETTUCCI, Andrea
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Novel analysis tool for the distance of gold dimers controlled by the DNA strand length on the DNA origami. [PDF]
J MicroscAbstract Metallic nanoparticle dimers have been used to enhance the excitation rate of single‐quantum emitters. The interparticle distance (d) of the dimers has a crucial influence on the signal enhancement. Therefore, precise control of d is desired for optimal performance. However, statistical analysis of d has been often restricted to a small number
Guckel J +5 more
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Applied Sciences, 2019 A method is proposed to expand the Z-directional measurement range of a fiber-based dual-detector chromatic confocal probe with a mode-locked femtosecond laser source.
Chong Chen +5 more
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Applied Sciences, 2021 Major modifications are made to the setup and signal processing of the method of in-situ measurement of the pitch of a diffraction grating based on the angles of diffraction of the diffracted optical frequency comb laser emanated from the grating. In the
Dong Wook Shin +6 more
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Traceable GISAXS measurements for pitch determination of a 25 nm self-assembled polymer grating [PDF]
, 2014 The feature sizes of only a few nanometers in modern nanotechnology and next-generation microelectronics continually increase the demand for suitable nanometrology tools. Grazing incidence small-angle X-ray scattering (GISAXS) is a versatile technique to
Hoell, Armin +5 more
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Ultra-low thermal conductivity and acoustic dynamics of Si nanostructured metalattices probed using ultrafast high harmonic beams [PDF]
EPJ Web of Conferences, 2019 We extend optical nanometrology capabilities to smaller dimensions by using tabletop coherent extreme ultraviolet (EUV) beams. Specifically, we characterize thermal transport and acoustic wave propagation in 3D periodic silicon inverse metalattices with
Abad Begoña +17 more
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