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Terahertz near-field microscopy
SPIE Proceedings, 2004We report on the development of an apertureless scanning near-field optical microscope for characterization of dielectric properties of nano-structures at terahertz frequencies. A spatial resolution of ≈ 150 nm is achieved, which corresponds to a sub-wavelength factor of ≈1/1000.
Hou-Tong Chen +2 more
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AIP Conference Proceedings, 1991
Super resolution optical microscopy in the near field will be discussed. A brief survey of the principles of the method of near field scanning optical microscopy will be presented along with selected results and demonstrations that resolutions an order of magnitude smaller than the wavelength can be achieved.
M. Isaacson, J. Cline, H. Barshatzky
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Super resolution optical microscopy in the near field will be discussed. A brief survey of the principles of the method of near field scanning optical microscopy will be presented along with selected results and demonstrations that resolutions an order of magnitude smaller than the wavelength can be achieved.
M. Isaacson, J. Cline, H. Barshatzky
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Scanning Near Field Optical Microscopy
1992This article reviews Scanning Near Field Optical Microscopy focusing on the different types of antennas which have been employed as sensors. A proposal for a coaxial tip as a new type of sensor is made in conjunction with a way of its fabrication.
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Scanning Near-Field Optical Microscopy/Near-Field Scanning Optical Microscopy
2018Scanning near-field optical microscopy (SNOM)/near-field scanning optical microscopy (NSOM) is one of the scanning probe microscopies, especially for investigation of optical properties and phenomena in nanometer scale. SNOM/NSOM observation provides high spatial resolution of 10–100 nm that conventional optical microscopes do not achieve, in principle.
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Conference on Lasers and Electro-Optics Europe, 1996
Near field microscopy is about ten years old. Unlike Scanning Tunneling Microscopy, its progress has been slow and somewhat erratic. Today, we can consider that this new tool is mature enough to be used in a few routine surface characterization procedures.
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Near field microscopy is about ten years old. Unlike Scanning Tunneling Microscopy, its progress has been slow and somewhat erratic. Today, we can consider that this new tool is mature enough to be used in a few routine surface characterization procedures.
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Graphene-Enhanced Infrared Near-Field Microscopy
Nano Letters, 2014Graphene is a promising two-dimensional platform for widespread nanophotonic applications. Recent theories have predicted that graphene can also enhance evanescent fields for subdiffraction-limited imaging. Here, for the first time we experimentally demonstrate that monolayer graphene offers a 7-fold enhancement of evanescent information, improving ...
Peining, Li +3 more
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Terahertz Near-Field Microscopy
2008We report on apertureless terahertz (THz) microscopy and its application for semiconductor characterization. Extreme subwavelength resolutions down to 150nm are achieved with few-cycle THz pulses having a bandwidth of 3THz. The imaging mechanism is characterize by time-resolved THz techniques.
Roland Kersting +3 more
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12th International Conference on Optical Fiber Sensors, 1997
Shear force distance control can be carried out using an auxiliary laser, but I will describe the use of a tuning fork technique in which interaction between tip and sample stiffens the fork and shifts its resonance frequency. We have shown that the damping of tip vibration that occurs in these distance control techniques is primarily due to the tip ...
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Shear force distance control can be carried out using an auxiliary laser, but I will describe the use of a tuning fork technique in which interaction between tip and sample stiffens the fork and shifts its resonance frequency. We have shown that the damping of tip vibration that occurs in these distance control techniques is primarily due to the tip ...
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Near Field Optics and Scanning Near Field Optical Microscopy
1996By near field optics the diffraction limit of light microscopy can be avoided. Contact imaging by energy transfer is a simple scheme to achieve this goal. Scanning Near Field Optical Microscopy (SNOM) using a tapered metal coated fibre with an aperture at the tip seems to reach a resolution limit at 30 nm.
U. C. Fischer +5 more
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