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A compact near-field scanning optical microscope

Ultramicroscopy, 1998
Abstract We present a recently constructed near-field scanning optical microscope which incorporates improvements over our previous designs. This microscope features an ultra-fine mechanical tip/sample approach with continuous submicron control over a range of several millimeters.
G Merritt   +3 more
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A metamaterial-scanning near-field optical microscope

Microwave and Optical Technology Letters, 2006
like a PMC surface for this direction of observation. It can also be noted that the fields are zero for /2, except when 0 and . Thus, the field will propagate along the surface in the direction of the strips, that is, in the direction for which the surface behaves like a hard surface. This corresponds to localized surface waves following the strips, as
H. Cory, Y. Hao, C. G. Parini
openaire   +1 more source

A cryogenic scattering-type scanning near-field optical microscope

Review of Scientific Instruments, 2013
Scattering-type scanning near-field optical microscopy (s-SNOM) provides few nanometer optical spatial resolution and is compatible with nearly any form of linear and nonlinear optical spectroscopy. We have developed a versatile s-SNOM instrument operating under cryogenic and variable temperature (∼20–500 K) and compatible with high magnetic fields (up
Honghua U, Yang   +3 more
openaire   +2 more sources

Mid‐infrared scanning near‐field optical microscope resolves 30 nm

Journal of Microscopy, 1999
We explore the performance of a scanning near‐field infrared microscope, which works by scattering tightly focused CO2 laser radiation (λ = 10 μm) from the apex of a metallized atomic force microscope tip. The infrared images of test samples prove a spatial resolution of 30 nm and are free of topographical and inertial artefacts, thus they should be of
Knoll, B., Keilmann, F.
openaire   +3 more sources

Optical constants from scattering-type scanning near-field optical microscope

Applied Physics Letters, 2021
Scattering-type scanning near-field optical microscopy (s-SNOM) allows for the characterization of optical properties of samples at the nanoscale, well below the diffraction limit of the interrogating wavelength. Typically, it relies on a model for the probe-sample interaction to extract complex optical constants of the sample.
Xiao Guo   +2 more
openaire   +1 more source

Near field scanning optical microscope for biological applications

Laser Applications to Chemical, Security and Environmental Analysis, 1996
In our biophysical laboratory systematic investigations of plague and choler microbes are carried out by different methods (conventional electron microscopy, scanning tunneling microscopy and atomic force microscopy). At present for the investigations we have develop a near field scanning optical microscope (NSOM).
V. B. Baibyrin   +4 more
openaire   +1 more source

KRIOSBOM101 low-temperature scanning near-field optical microscope

Bulletin of the Lebedev Physics Institute, 2010
An optical scanning near-field microscope was developed. A cryostat for obtaining low temperatures in the range of 1.8–300 K was designed. The microscope control unit and software were advanced taking into account the temperature range. A room-temperature measurement technique was refined on test aluminum gratings on glass with a period of 4 µm.
M. G. Petrova   +3 more
openaire   +1 more source

A storage Dewar near-field scanning optical microscope

Ultramicroscopy, 2000
A near-field scanning optical microscope for operation within a storage Dewar is described. It was designed for studies of opaque samples and operates in the collection mode. Illumination can be either through the tip or from the side via a separate fiber. Scans can be begun within 2 h after start of cooldown.
, Eytan   +3 more
openaire   +2 more sources

Micromachining of diamond with a near-field scanning optical microscope

Optics Letters, 2001
Direct-write laser micromachining of diamond on a submicrometer scale with a near-field scanning optical microscope with an uncoated tapered fiber tip has been demonstrated. Micromachined structures can be imaged in situ immediately after modification of the sample.
I I, Smolyaninov, C C, Davis
openaire   +2 more sources

Towards High-Speed Near-Field Scanning Optical Microscope

Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology, 2004
Recently, near-field scanning optical microscopy (NSOM) and its variations, which combine the scanning probe technology with optical microscopy, have been intensively applied in the study of biology, material science, surface chemistry, information storage, and nanofabrication.
Yuan Wang   +3 more
openaire   +1 more source

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