Results 231 to 240 of about 154,916 (330)

In‐Operando 4D‐STEM and STEM‐EBIC Imaging of Electric Fields and Charge Carrier Behavior in Biased Silicon p–n Junctions

open access: yesAdvanced Electronic Materials, EarlyView.
This work presents a study of how 4D‐STEM centre of mass measurements and STEM‐EBIC can be used to map the positions, directions, and strengths of electric fields in semiconductor devices. The contrast mechanisms of both techniques are tested and compared with simulations to build a robust analysis of an in situ device in the electron microscope ...
Eoin Moynihan   +5 more
wiley   +1 more source

Neutral Beam Injection Calculations for Torsatrons

open access: yes, 1979
Anderson, D. T.   +3 more
openaire   +2 more sources

Environmental Stability and Electronic Properties of Individual Flakes of Ti2CTx MXene

open access: yesAdvanced Electronic Materials, EarlyView.
The paper presents a synthesis of large Ti2CTx MXene flakes with sizes reaching 40 µm and examines their environmental stability and electronic behavior. It demonstrates that monolayer flakes degrade rapidly in ambient conditions, leading to semiconducting‐like behavior with low conductivity and mobility. In contrast, multilayer flakes exhibit enhanced
Md. Ibrahim Kholil   +5 more
wiley   +1 more source

A Polymorphic Reconfigurable Multi‐Electrode Device Based on Electrically Bistable Nanostructured Metallic Films

open access: yesAdvanced Electronic Materials, EarlyView.
A polymorphic reconfigurable multi‐electrode device based on electrically bistable nanostructured metallic films. The adaptive reconfiguration properties of the nanostructured network under specific input voltages drive the reprogrammability of the device. This system can be employed for the implementation of polymorphic devices, which can be used both
Silvia Bressan   +4 more
wiley   +1 more source

A transportable laser-plasma accelerator in the MeV range. [PDF]

open access: yesSci Rep
Morel E   +15 more
europepmc   +1 more source

Reversible and Controllable Transition Between Filamentary and Interfacial Resistive Switching in HfO2‐Based Memristors

open access: yesAdvanced Electronic Materials, EarlyView.
5 nm HfO2 memristors exhibit a fully reversible, voltage‐controlled transition between filamentary and interfacial switching within the same device. At high voltages, a filament forms and dominates the conduction, whereas at lower voltages the device reversibly returns to interfacial mode without defect accumulation, implying a new reversible ...
Cuo Wu   +8 more
wiley   +1 more source

Experimental determination of structural motifs of interference-free water undecamer cluster (H<sub>2</sub>O)<sub>11</sub>. [PDF]

open access: yesNat Commun
Wang T   +15 more
europepmc   +1 more source

Tunable Electronic and Optoelectronic Properties of MoS2 Through Molecular Coverage‐Controlled Polyoxometalate Doping

open access: yesAdvanced Electronic Materials, EarlyView.
Molecular charge transfer at the V12‐DyPc/MoS2 interface stabilizes trions, suppressing neutral A‐exciton emission and enabling controlled modulation of the A–‐trion population, bridging excitonic physics with polyoxometalate charge‐transport functionality.
Jean‐Pierre Glauber   +10 more
wiley   +1 more source

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