Results 161 to 170 of about 11,074 (265)

Evaluating cluster counting of Cs complexes through the study of nitrogen implanted zirconium. [PDF]

Sci Rep
Balamurugan AK, Manojkumar PA, Kumar ES, Ramaseshan R.   +3 more
europepmc   +1 more source

A DC Compact Model of an Organic Electrochemical Transistor Based on a Semiconductor Physics and Thermodynamic Approach

Advanced Electronic Materials, EarlyView.
This work presents a physics‐based DC compact model of an Organic Electrochemical Transistor (OECT) that takes into account the faradaic redox reaction in the above threshold regime and incorporates the diffusive current of the subthreshold regime based on semiconductor physics.
Ermias Telahun Teka, Yeohoon Yoon, Laura Teuerle, Tommy Meier, Hans Kleemann, Ghader Darbandy, Benjamin Iniguez   +6 more
wiley   +1 more source

Chemical Load-Induced Surface Nanocrystallization in Nitrided Martensitic Stainless Steel. [PDF]

Nanomaterials (Basel)
Yang X, Che H, Lei M.
europepmc   +1 more source

Silicon Nitride Resistive Memories

Advanced Electronic Materials, EarlyView.
Amorphous SiNx is an attractive resistance switching material for ReRAM applications due to its physicochemical properties, such as humidity resistance, low oxygen diffusivity, and is used as a metal diffusion blocker. By modifying the ratio between N and Si atoms, the microstructure of the SiNx is affected, rendering it possible to change the ...
Alexandros‐Eleftherios Mavropoulis, Nikolaos Vasileiadis, Iosif‐Angelos Fyrigos, Emmanouil Stavroulakis, Caroline Bonafos, Pascal Normand, Georgios Ch. Sirakoulis, Panagiotis Dimitrakis   +7 more
wiley   +1 more source

Mutagenesis of Highland barley (Hordeum vulgare L. Var. nudum) using nitrogen ion beam implantation: screening of phenotypic Var.ations and comparative transcriptome analysis. [PDF]

BMC Genomics
Yu HY, Zhang YH, Li H, Feng H.
europepmc   +1 more source

Self‐Adhesive Conductive Elastomers for Gel‐Free Biopotential Recording

Advanced Electronic Materials, EarlyView.
σPOMaC, a self‐adhesive conductive citrate elastomer incorporating PEDOT:PSS and DBSA, enables gel‐free biopotential electrodes with stable conductivity and intrinsic skin adhesion. The composite exhibits low resistivity (∼ 0.02 Ω·cm), robust electrical performance during repeated use, and reliable on‐body ECG acquisition comparable to Ag/AgCl ...
Kirstie M. K. Queener, Alec Brewer, He Sun, Jack Twiddy, Vladimir A. Pozdin, Koji Sode, Alper Bozkurt, Michael Daniele   +7 more
wiley   +1 more source

Scalable nanoscale positioning of highly coherent color centers in prefabricated diamond nanostructures. [PDF]

Nat Commun
Kim S, London P, Yang D, Hughes LB, Ahlers J, Meynell S, Mitchell WJ, Mukherjee K, Bleszynski Jayich AC.   +8 more
europepmc   +1 more source

Disorder‐Driven Fast Na+ Transport: From Crystalline to Amorphous Networks in the Mixed‐Anion NaTaOxCl6−2x Oxychlorides

Advanced Energy Materials, EarlyView.
Oxygen substitution in NaTaOxCl6‐2x drives structural evolution from isolated [TaCl6]– octahedra, through oxygen‐bridged [Ta2OCl10]2– dimers, toward extended trans‐[TaO2Cl4]3– chain‐like arrangements. At intermediate compositions, zero‐dimensional corner‐sharing motifs are proposed to create a flexible, disordered framework that peaks ionic ...
Justin Leifeld, Abigail C. Parsons, Alexandra Morscher, Xabier Martinez de Irujo‐Labalde, Marvin A. Kraft, Oskar G. Soulas, Bibek Samanta, Wiebke Zielasko, Neelam Yadav, Kyra Strotmann, Niina Jalarvo, Bruno V. M. Rodrigues, Adam Slabon, Philipp Adelhelm, Michael Ryan Hansen, David O. Scanlon, Wolfgang G. Zeier, Alexander G. Squires   +17 more
wiley   +1 more source

Nitriding of Commercially Pure (CP) Titanium Grade 2 by the Active Screen Method. [PDF]

Materials (Basel)
Frączek T, Pilarska M, Skuza Z, Prusak R.   +3 more
europepmc   +1 more source

Data‐Driven Review and Machine Learning Prediction of Diamond Vacancy Center Synthesis

Advanced Intelligent Systems, EarlyView.
A machine learning framework is applied to photoluminescence spectra to extract linewidths and uncover how NV, SiV, GeV, and SnV centers evolve with growth and processing conditions. Unified normalization and k‐fold validation reveal cross‐method trends and enable rapid prediction of defect size and fabrication parameters, offering a data‐driven route ...
Zhi Jiang, Marco Peres, Carlo Bradac, Gil Gonçalves   +3 more
wiley   +1 more source