Results 201 to 210 of about 260,261 (363)
Very high speed differential optoelectronic algorithmic ADC using n–i(MQW)–n SEED technology [PDF]
Said F. Al-Sarawi+4 more
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A spin group (SG)‐based mechanism is proposed to realize a single pair of Weyl points. PT‐symmetric nodal lines (NLs) persist under T‐breaking, protected by the combination of SG and P symmetry. When considering spin‐orbit coupling, the SG‐protected NL will split into Weyl points, which will also induce anomalous transport phenomena arising from ...
Shifeng Qian+6 more
wiley +1 more source
Intervalence band absorption in InP and related materials for optoelectronic device modeling [PDF]
Jason Taylor, Valery Tolstikhin
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Ozone‐based gas‐phase metal‐assisted chemical etching enables unprecedented room‐temperature fabrication of high‐quality silicon nanowires. The superior oxidation potential of O3 drives rapid vertical etching (1 µm min−1) while maintaining exceptional structural integrity. The pristine nanowire surfaces enable high‐performance core‐shell photodetectors
Hyein Cho+11 more
wiley +1 more source
Optoelectronic RF signal mixing using an electroabsorption waveguide as an integrated photodetector/mixer [PDF]
Dong‐Soo Shin+6 more
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Supercompliant Lattice Boosts n‐type AgSbTe2 Thermoelectrics
The supercompliant lattice design enables the first realization of n‐type electrical transport in AgSbTe2 by overcoming intrinsic electron‐killer defects and exceeding the doping limits imposed by the conventional Hume–Rothery rule. Accordingly, the best performance n‐type Ag0.8Na0.3Sb0.6Bi0.4Te2 sample achieves a low κ of 0.27 W·m−1·K−1 that ...
Ruoyan Li+15 more
wiley +1 more source
Optoelectronic Multi-Chip Modules Based on Imaging Fiber Bundle Structures [PDF]
Donald M. Chiarulli, Steven P. Levitan
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Optical Control of Ferroelectric Imprint in BiFeO3
Above‐bandgap irradiation at room temperature enables on‐demand optical control of defect‐driven built‐in electric fields in BiFeO₃ thin films, fabricated via scalable, chemical spray pyrolysis. These fields, otherwise “frozen‐in,” can cause severe device degradation, including non‐switchable polarization, dead layers near interfaces, and polarization ...
Haoze Zhang+8 more
wiley +1 more source
Noise measurement of optoelectronic coupled devices for reliability screening: Is there an optimal threshold? [PDF]
Jiansheng Xu
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