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Integrated Schottky diode parameters extraction
Proceedings. International Semiconductor Conference, 2003The paper describes the integration of a Schottky diode into IC process for logic and analogic applications. The parameters extraction of the integrated Schottky diodes takes into account the layout and process aspects. The developed models allow significant device performances improvement.
M. Badila, S. Georgescu
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Parameter Extraction from Spaceborne MOSFETs
IEEE Transactions on Nuclear Science, 1985An addressable matrix of 32 CMOS transistors was designed into a test chip to be flown on the Combined Release and Radiation Effects Satellite (CRRES). In this paper the matrix is described along with a SPICE-like parameter extraction procedure called JMOSFIT, and Cobalt 60 radiation test results are presented that illustrate the shift in the 21-MOSFET
M. G. Buehler, B. T. Moore, R. H. Nixon
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Extraction of Dispersion Parameters
2016As demonstrated previously, the propagation of waves in distributed and discrete periodic structures can be described by a set of dispersion parameters such as wavenumber and Bloch impedance or by effective material parameters. In this chapter, different methods to obtain these parameters from a given geometry are introduced and investigated.
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Parameter extraction for bipolar transistors
IEEE Transactions on Electron Devices, 1989Novel methods for parameter extraction for bipolar transistors are presented. Emphasis is placed on reliable measurements of small-size transistors, examples are shown for Si integrated circuit transistors with emitters smaller than 10 mu m/sup 2/. Advantages over measurements on large-area test devices are discussed.
J.S. Park, A. Neugroschel
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Extracting causal time domain parameters
2004 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, 2004Parameters of a device are normally given in a frequency range of interest. To use them in a time-domain simulator requires their time-domain correspondents to be strictly causal in time. However, these time-domain correspondents are often non-causal in time if they are obtained from simple transformations of the frequency-domain parameters known over ...
Shuiping Luo, Zhizhang Chen
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Wafer-Scale Photonic Parameter Extraction
CLEO 2024Wafer-scale variation of waveguide dimensions and refractive index determine the fabrication yield and design tolerances of photonic integrated circuits. We describe a technique to accurately measure the statistical properties of these parameters for dielectric waveguides.
Jordan N. Butt +6 more
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Optimizing Extraction Parachute Operational Parameters
23rd AIAA Aerodynamic Decelerator Systems Technology Conference, 2015A current area of interest in the operational and test community is the application of aerial delivery at high speed and at relatively low altitudes. The High-Speed Container Delivery System (HSCDS) is such a program intended to address this type of operational need.
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