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Thermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling

open access: yesAdvanced Engineering Materials, EarlyView.
Focused ion beam (FIB) milling is a common tool for nanoscale material processing, however irradiation damage, redeposition, and contamination can occur. We use several characterization tools to show FIB‐induced effects beyond 1 mm from the milled area.
Thomas W. Pfeifer   +3 more
wiley   +1 more source

Pounding imparts internal strength to rubble-piles. [PDF]

open access: yesSci Rep
Ormö J   +6 more
europepmc   +1 more source

Neisseria meningitidis filamentous phage MDA promotes colonisation by selecting hyperadhesive pili variants. [PDF]

open access: yesNat Commun
Mouville C   +11 more
europepmc   +1 more source

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