Results 31 to 40 of about 9,739,868 (208)

Direct observation of changes in the effective minority-carrier lifetime of SiNx-passivated n-type crystalline-silicon substrates caused by potential-induced degradation and recovery tests [PDF]

open access: yes, 2017
We directly observed reductions in the effective minority-carrier lifetime (τ_) of n-type crystalline silicon (c-Si) substrates with silicon-nitride passivation films caused by potential-induced degradation (PID).
Naoyuki Nishikawa   +5 more
core   +1 more source

Patents, software and hardware for PID control: an overview and analysis of the current art [PDF]

open access: yes, 2006
Proportional-integral-derivative (PID) control provides simplicity, clear functionality, and ease of use. Since the invention of PID control in 1910 (largely owing to Elmer Sperry’s ship autopilot) and the straightforward Ziegler-Nichol (Z-N) tuning rule
Ang, K.H., Li, Y., Chong, G.C.Y.
core   +2 more sources

PID control system analysis, design, and technology [PDF]

open access: yes, 2005
Designing and tuning a proportional-integral-derivative (PID) controller appears to be conceptually intuitive, but can be hard in practice, if multiple (and often conflicting) objectives such as short transient and high stability are to be achieved ...
Ang, K.H.   +3 more
core   +1 more source

Investigation on Potential-Induced Degradation in a 50 MWp Crystalline Silicon Photovoltaic Power Plant

open access: yesInternational Journal of Photoenergy, 2018
The regular performance deterioration of P-type crystalline silicon solar modules and module strings caused by potential-induced degradation in a photovoltaic power plant was found in the field.
Jingsheng Huang   +4 more
doaj   +1 more source

Multistage performance deterioration in n-type crystalline silicon photovoltaic modules undergoing potential-induced degradation [PDF]

open access: yes, 2018
This study addresses the behavior of n-type front-emitter (FE) crystalline-silicon (c-Si) photovoltaic (PV) modules in potential-induced degradation (PID) tests with a long duration of up to 20 days.
Masuda, Atsushi   +7 more
core   +1 more source

Potential-Induced Degradation of the Shunting Type: on the Origin of Sodium in Shunt Paths

open access: yes, 2022
Potential-induced degradation rapidly and significantly affects the photovoltaic (PV) module's performance due to a high potential difference across the PV cell and the grounded module's frame.[1] PID has various types where PID of the shunting type (PID-
DAENEN, Michael   +4 more
core   +1 more source

Monitoring the natural recovery of potential induced degradation in poly-crystalline photovoltaic modules

open access: yesJournal of Energy in Southern Africa, 2022
Potential induced degradation (PID) is a defect that has a severe effect on the performance of photovoltaic (PV) modules in field conditions. It is caused by leakage currents and the accumulation of sodium ions (Na+) between the anti-reflective coating ...
I.M. Kwembur   +3 more
doaj   +1 more source

Prevention of PID Phenomenon for Solar Panel Based on Mathematical Data Analysis Models

open access: yesMathematics, 2023
In recent years, the problem of potential-induced degradation (PID) phenomenon has been deeply associated with solar power issues because it causes serious power attenuation of solar panels and results in lowering its power generation efficiency.
You-Shyang Chen   +5 more
doaj   +1 more source

Impact of solar cell cracks caused during potential-induced degradation (PID) tests [PDF]

open access: yes, 2021
Potential-induced degradation (PID) of photovoltaic (PV) modules is one of the most severe types of degradation in modern modules, where power losses depend on the strength of the electric field, the temperature and relative humidity, and the PV module ...
Dhimish, Mahmoud, Kettle, Jeff
core   +1 more source

Changes in the current density-voltage and external quantum efficiency characteristics of n-type single-crystalline silicon photovoltaic modules with a rear-side emitter undergoing potential-induced degradation [PDF]

open access: yes, 2016
This study addresses the potential-induced degradation (PID) of n-type single-crystalline silicon (sc-Si) photovoltaic (PV) modules with a rear-side emitter.
Masuda, Atsushi   +2 more
core   +1 more source

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