Results 261 to 270 of about 189,528,022 (311)
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International Journal of Injury Control and Safety Promotion, 2014
When planning a research study, the issue of the necessary sample size is one that is extremely important.
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When planning a research study, the issue of the necessary sample size is one that is extremely important.
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IEEE Design & Test of Computers, 2007
In the past few years, many researchers have claimed that power issues in test applications are primarily due to scan shifting. The author of this column explains why this conclusion is simply not realistic.
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In the past few years, many researchers have claimed that power issues in test applications are primarily due to scan shifting. The author of this column explains why this conclusion is simply not realistic.
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Most powerful robust tests or robust most powerful tests
Mathematica Applicanda, 1995Summary: The most powerful robust test and the robust most powerful test in a simple Gaussian model are constructed and discussed.
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Urban Education, 2004
The purpose of this study was to explore the response patterns of African American students to the state certification questions. More specifically, the participants’ explanations of their responses and their perceptions of the source of knowledge they used to answer the questions were discussed. To achieve this purpose, three research questions served
Shelley McIntosh, Pamela Norwood
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The purpose of this study was to explore the response patterns of African American students to the state certification questions. More specifically, the participants’ explanations of their responses and their perceptions of the source of knowledge they used to answer the questions were discussed. To achieve this purpose, three research questions served
Shelley McIntosh, Pamela Norwood
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A Comparison Between the Power of the Durbin-Watson Test and the Power of the BLUS Test
Journal of the American Statistical Association, 1969Abstract In an earlier paper [5] the authors compared the power of the BLUS test with the probability of a correct decision of the Durbin-Watson bounds test. A method to compute the distribution of the Von Neumann ratio under the null hypothesis and under the alternative hypothesis was given.
A. P. J. Abrahamse, J. Koerts
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Testing for genetic association: A powerful score test
Statistics in Medicine, 2008AbstractTo study the association between a candidate gene and a complex genetic disease, Pearson's χ2 statistic can be applied to an m × 2 contingency table, where the m categories correspond to m haplotypes or marker alleles. For m>2, two alternative approaches for Pearson's χ2 can be followed, which are more powerful if one haplotype or marker ...
R, El Galta +2 more
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2011 Asian Test Symposium, 2011
In this paper we examine several embedded low power test schemes that we have proposed over the last few years. These solutions are aimed at reducing the switching activity during all scan-based test operations, particularly including those developed for BIST or deployed to perform on-chip test data compression.
Xijiang Lin +5 more
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In this paper we examine several embedded low power test schemes that we have proposed over the last few years. These solutions are aimed at reducing the switching activity during all scan-based test operations, particularly including those developed for BIST or deployed to perform on-chip test data compression.
Xijiang Lin +5 more
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Test and diagnosis of power switches
17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case they can completely isolate a ...
Valka, Miroslav +7 more
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Power constraint scheduling of tests
Proceedings of 7th International Conference on VLSI Design, 2002This paper presents motivation for considering the power constraint in testing and gives a model-based formulation of the new test scheduling problem. Optimum test scheduling algorithms are presented for both equal and unequal test length cases under the power constraint. The algorithms consist of three basic steps.
Richard M. Chou +2 more
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2022 IEEE European Test Symposium (ETS), 2022
Likith Kumar Manchukonda +2 more
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Likith Kumar Manchukonda +2 more
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