Results 1 to 10 of about 5,062,277 (278)

A Design Methodology for Fault-Tolerant Neuromorphic Computing Using Bayesian Neural Network

open access: yesMicromachines, 2023
Memristor crossbar arrays are a promising platform for neuromorphic computing. In practical scenarios, the synapse weights represented by the memristors for the underlying system are subject to process variations, in which the programmed weight when read
Di Gao, Xiaoru Xie, Dongxu Wei
doaj   +1 more source

An Investigation of Process Variations and Mismatch Characteristics of Vertical Bipolar Junction Transistors

open access: yesIEEE Access, 2023
Bipolar junction transistors (BJT) are widely used integrated devices for analog circuits. For most of analog applications, the process variation and the match performance of BJT pairs are critical for the circuit design.
Xiaonian Liu, Zichen Yang
doaj   +1 more source

A Computationally Efficient Model for FDSOI MOSFETs and Its Application for Delay Variability Analysis

open access: yesApplied Sciences, 2022
This paper proposes a compact, physics-based current model for fully depleted silicon-on-insulator (FDSOI) MOSFETs and applies it to delay variability analysis.
Zhiyi Mao   +3 more
doaj   +1 more source

Novel level shifter based physical unclonable function circuit design

open access: yes网络与信息安全学报, 2021
Level shifters are widely used in low-power, multi-threshold integrated circuit chips.A novel physical unclonable function (PUF) design based on cross-coupled level shifter was proposed.In this work, a single switching transistor was inserted in the ...
Lijuan HAN   +5 more
doaj   +3 more sources

Improvement of production process variations of bolster spring of a train bogie manufacturing industry: a six-sigma approach

open access: yesCogent Engineering, 2023
The need for improved productivity without sacrificing quality, which is in line the prime target of many manufacturing industries. The aim of this study is to investigate the causes of production variation: a case study of the rail manufacturing ...
Ilesanmi Daniyan   +4 more
doaj   +1 more source

VASTA: A Wide Voltage Statistical Timing Analysis Tool Based on Variation-Aware Cell Delay Models

open access: yesIEEE Access, 2020
In the advanced technology nodes, process parameter variations are increasingly resulting in unpredictable device behavior. The issue is even aggravated by low power requirements which stretches the transistor operation into near-threshold regime ...
Wenjie Fu   +4 more
doaj   +1 more source

Guided Electromagnetic Wave Technique for IC Authentication

open access: yesSensors, 2020
Counterfeiting of an Integrated Circuit (IC) has become a significant concern for electronics manufacturers, system integrators, and end users. It is necessary to find a robust implementation that is efficient, low cost, and noninvasive in detection and ...
Mosabbah Mushir Ahmed   +4 more
doaj   +1 more source

Spatio-Temporal Variational Gaussian Processes [PDF]

open access: yes, 2021
Peer ...
Hamelijnck, Oliver   +4 more
openaire   +3 more sources

DFM: “Design for Manufacturing” or “Design Friendly Manufacturing”

open access: yesJournal of Microelectronic Manufacturing, 2020
As the IC manufacturing enter sub 20nm tech nodes, DFM become more and more important to make sure more stable yield and lower cost. However, by introducing newly designed hardware (1980i etc.) process chemical (NTD) and Control Algorithm (Focus APC ...
Wenzhan Zhou, Hung-Wen Chao, Yu Zhang
doaj   +1 more source

Variational Gaussian Process Diffusion Processes

open access: yes, 2023
International Conference on Artificial Intelligence and Statistics (AISTATS ...
Verma, Prakhar   +2 more
openaire   +3 more sources

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