Results 11 to 20 of about 1,561,006 (268)
A Design Methodology for Fault-Tolerant Neuromorphic Computing Using Bayesian Neural Network
Micromachines, 2023 Memristor crossbar arrays are a promising platform for neuromorphic computing. In practical scenarios, the synapse weights represented by the memristors for the underlying system are subject to process variations, in which the programmed weight when read
Di Gao, Xiaoru Xie, Dongxu Wei
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Variational Elliptical Processes
CoRR, 2023 We present elliptical processes, a family of non-parametric probabilistic models that subsume Gaussian processes and Student's t processes. This generalization includes a range of new heavy-tailed behaviors while retaining computational tractability. Elliptical processes are based on a representation of elliptical distributions as a continuous mixture ...
Bånkestad, Maria +3 more
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Variational Gaussian Process Diffusion Processes
CoRR, 2023 International Conference on Artificial Intelligence and Statistics (AISTATS ...
Prakhar Verma, Vincent Adam, Arno Solin
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IEEE Access, 2023 Bipolar junction transistors (BJT) are widely used integrated devices for analog circuits. For most of analog applications, the process variation and the match performance of BJT pairs are critical for the circuit design.
Xiaonian Liu, Zichen Yang
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Applied Sciences, 2022 This paper proposes a compact, physics-based current model for fully depleted silicon-on-insulator (FDSOI) MOSFETs and applies it to delay variability analysis.
Zhiyi Mao +3 more
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VASTA: A Wide Voltage Statistical Timing Analysis Tool Based on Variation-Aware Cell Delay Models
IEEE Access, 2020 In the advanced technology nodes, process parameter variations are increasingly resulting in unpredictable device behavior. The issue is even aggravated by low power requirements which stretches the transistor operation into near-threshold regime ...
Wenjie Fu +4 more
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Guided Electromagnetic Wave Technique for IC Authentication
Sensors, 2020 Counterfeiting of an Integrated Circuit (IC) has become a significant concern for electronics manufacturers, system integrators, and end users. It is necessary to find a robust implementation that is efficient, low cost, and noninvasive in detection and ...
Mosabbah Mushir Ahmed +4 more
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STT-BSNN: An In-Memory Deep Binary Spiking Neural Network Based on STT-MRAM
IEEE Access, 2021 This paper proposes an in-memory binary spiking neural network (BSNN) based on spin-transfer-torque magnetoresistive RAM (STT-MRAM). We propose residual BSNN learning using a surrogate gradient that shortens the time steps in the BSNN while maintaining ...
Van-Tinh Nguyen +3 more
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DFM: “Design for Manufacturing” or “Design Friendly Manufacturing”
Journal of Microelectronic Manufacturing, 2020 As the IC manufacturing enter sub 20nm tech nodes, DFM become more and more important to make sure more stable yield and lower cost. However, by introducing newly designed hardware (1980i etc.) process chemical (NTD) and Control Algorithm (Focus APC ...
Wenzhan Zhou, Hung-Wen Chao, Yu Zhang
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Time to Digital Sensing for Multilevel RRAM Cells
IEEE Access, 2021 Memristors offer the possibility of implementing multilevel cells in Resistive RAMs providing high-density non-volatile data storage solutions. However the writing and reading processes when these devices are integrated into a crossbar is a problem that ...
Amadeo Gracia De Herranz +1 more
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