Results 1 to 10 of about 25,061,419 (267)
Process variation in Laser Powder Bed Fusion of Ti-6Al-4V
Additive Manufacturing, 2021 In this work, a concept of using surface roughness data as an evaluation tool of the process variation in a commercial Laser Powder Bed Fusion (L-PBF) machine is demonstrated.
Zhuoer Chen, Xinhua Wu, C. Davies
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A Design Methodology for Fault-Tolerant Neuromorphic Computing Using Bayesian Neural Network
Micromachines, 2023 Memristor crossbar arrays are a promising platform for neuromorphic computing. In practical scenarios, the synapse weights represented by the memristors for the underlying system are subject to process variations, in which the programmed weight when read
Di Gao, Xiaoru Xie, Dongxu Wei
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IEEE Access, 2023 Bipolar junction transistors (BJT) are widely used integrated devices for analog circuits. For most of analog applications, the process variation and the match performance of BJT pairs are critical for the circuit design.
Xiaonian Liu, Zichen Yang
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Applied Sciences, 2022 This paper proposes a compact, physics-based current model for fully depleted silicon-on-insulator (FDSOI) MOSFETs and applies it to delay variability analysis.
Zhiyi Mao +3 more
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Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation [PDF]
Measurement and Modeling of Computer Systems, 2018 Compared to planar (i.e., two-dimensional) NAND flash memory, 3D NAND flash memory uses a new flash cell design, and vertically stacks dozens of silicon layers in a single chip.
Yixin Luo +4 more
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VASTA: A Wide Voltage Statistical Timing Analysis Tool Based on Variation-Aware Cell Delay Models
IEEE Access, 2020 In the advanced technology nodes, process parameter variations are increasingly resulting in unpredictable device behavior. The issue is even aggravated by low power requirements which stretches the transistor operation into near-threshold regime ...
Wenjie Fu +4 more
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Guided Electromagnetic Wave Technique for IC Authentication
Sensors, 2020 Counterfeiting of an Integrated Circuit (IC) has become a significant concern for electronics manufacturers, system integrators, and end users. It is necessary to find a robust implementation that is efficient, low cost, and noninvasive in detection and ...
Mosabbah Mushir Ahmed +4 more
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STT-BSNN: An In-Memory Deep Binary Spiking Neural Network Based on STT-MRAM
IEEE Access, 2021 This paper proposes an in-memory binary spiking neural network (BSNN) based on spin-transfer-torque magnetoresistive RAM (STT-MRAM). We propose residual BSNN learning using a surrogate gradient that shortens the time steps in the BSNN while maintaining ...
Van-Tinh Nguyen +3 more
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DFM: “Design for Manufacturing” or “Design Friendly Manufacturing”
Journal of Microelectronic Manufacturing, 2020 As the IC manufacturing enter sub 20nm tech nodes, DFM become more and more important to make sure more stable yield and lower cost. However, by introducing newly designed hardware (1980i etc.) process chemical (NTD) and Control Algorithm (Focus APC ...
Wenzhan Zhou, Hung-Wen Chao, Yu Zhang
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Time to Digital Sensing for Multilevel RRAM Cells
IEEE Access, 2021 Memristors offer the possibility of implementing multilevel cells in Resistive RAMs providing high-density non-volatile data storage solutions. However the writing and reading processes when these devices are integrated into a crossbar is a problem that ...
Amadeo Gracia De Herranz +1 more
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