Results 231 to 240 of about 1,561,006 (268)

Process Variations and Process-Tolerant Design

20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07), 2007
While CMOS technology has served semiconductor industry marvelously (by allowing nearly exponential increase in performance and device integration density), it faces some major roadblocks at sub-90nm process nodes due to the intrinsic physical limitations of the devices.
Swarup Bhunia   +2 more
openaire   +1 more source

Variations in the height of the odontoid process

Neuroradiology, 1973
The height of the odontoid process is discussed with respect to the anterior arch of the atlas. Three situations are considered, viz. the normal odontoid process, the hypoplastic odontoid process, a minor form of dens aplasia showing a predisposition to luxation, and the hypertrophic odontoid process, which occurs in two forms, depending on whether it ...
A, Wackenheim, J J, Wenger
openaire   +2 more sources

Variation and Control of Process Behavior

International Journal of Radiation Oncology*Biology*Physics, 2008
The purpose of this work was to highlight the importance of controlling process variability for successful quality assurance (QA). We describe the method of statistical process control for characterizing and controlling a process. Traditionally, QA has been performed by comparing some important measurement (e.g., linear accelerator output) against a ...
Todd, Pawlicki, Matthew, Whitaker
openaire   +2 more sources

Variational Gaussian process classifiers

IEEE Transactions on Neural Networks, 2000
Gaussian processes are a promising nonlinear regression tool, but it is not straightforward to solve classification problems with them. In this paper the variational methods of Jaakkola and Jordan are applied to Gaussian processes to produce an efficient Bayesian binary classifier.
Mark N. Gibbs, David J. C. MacKay
openaire   +2 more sources

Stochastic Variations in Queuing Processes

Operations Research, 1963
In this paper we consider a queuing process in which there are two mean arrival and service rates. Not only does the system randomly change from one mode of service and arrival to the other, but units arrive at random and require varying amounts of service.
Eisen, M., Tainiter, M.
openaire   +2 more sources

A process variation detection method

2010 East-West Design & Test Symposium (EWDTS), 2010
A new simple and versatile PV detection method is proposed that allows detecting MOS transistor's parameters variation. Theoretical analysis and simulation results for threshold voltage, mobility, oxide thickness prove the performance of the circuit (with the basic method).
Melikyan V., Mirzoyan D., Petrosyan G.
openaire   +1 more source

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