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Ultrasonic-Based Quantification and Process Parameter Optimization of Anisotropy and Heterogeneity in WAAM 2319 Aluminum Alloy. [PDF]
Li C, Liu H, Wang X, He J, Guan X.
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Process Variations and Process-Tolerant Design
20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07), 2007While CMOS technology has served semiconductor industry marvelously (by allowing nearly exponential increase in performance and device integration density), it faces some major roadblocks at sub-90nm process nodes due to the intrinsic physical limitations of the devices.
Swarup Bhunia +2 more
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Variations in the height of the odontoid process
Neuroradiology, 1973The height of the odontoid process is discussed with respect to the anterior arch of the atlas. Three situations are considered, viz. the normal odontoid process, the hypoplastic odontoid process, a minor form of dens aplasia showing a predisposition to luxation, and the hypertrophic odontoid process, which occurs in two forms, depending on whether it ...
A, Wackenheim, J J, Wenger
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Variation and Control of Process Behavior
International Journal of Radiation Oncology*Biology*Physics, 2008The purpose of this work was to highlight the importance of controlling process variability for successful quality assurance (QA). We describe the method of statistical process control for characterizing and controlling a process. Traditionally, QA has been performed by comparing some important measurement (e.g., linear accelerator output) against a ...
Todd, Pawlicki, Matthew, Whitaker
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Variational Gaussian process classifiers
IEEE Transactions on Neural Networks, 2000Gaussian processes are a promising nonlinear regression tool, but it is not straightforward to solve classification problems with them. In this paper the variational methods of Jaakkola and Jordan are applied to Gaussian processes to produce an efficient Bayesian binary classifier.
Mark N. Gibbs, David J. C. MacKay
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Stochastic Variations in Queuing Processes
Operations Research, 1963In this paper we consider a queuing process in which there are two mean arrival and service rates. Not only does the system randomly change from one mode of service and arrival to the other, but units arrive at random and require varying amounts of service.
Eisen, M., Tainiter, M.
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A process variation detection method
2010 East-West Design & Test Symposium (EWDTS), 2010A new simple and versatile PV detection method is proposed that allows detecting MOS transistor's parameters variation. Theoretical analysis and simulation results for threshold voltage, mobility, oxide thickness prove the performance of the circuit (with the basic method).
Melikyan V., Mirzoyan D., Petrosyan G.
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