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Modeling ellipsometric measurement of novel 3D structures with RCWA and FEM simulations
Proceedings of SPIE, 2016Alain Diebold, Nicholas Keller
exaly
Optical Characterization of Moiré Photonic Crystals Using the RCWA Method
2024 XVIII National Meeting on Optics and the IX Andean and Caribbean Conference on Optics and its Applications (ENO-CANCOA)J. F. Calderon, Carlos A. Galindez
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