Results 21 to 30 of about 1,677 (197)
Time-Efficient, Accurate, and Experimentally Grounded Optical Modeling of Multiscale-Textured Thin-Film Solar Cells. [PDF]
Glob ChallAccurate prediction of optical performance in solar cells with multiscale‐textured interfaces is essential for optimizing light management in next‐generation photovoltaics.
Saitta F +5 more
europepmc +2 more sources
Enhancement of Photodetector Responsivity in Standard SOI CMOS Processes by introducing Resonant Grating Structures [PDF]
Journal of the European Optical Society-Rapid Publications, 2011 A new photodetector concept is described, which is fully compatible with the standard SOI CMOS process and does not require any post-processing steps. Our simulations are based on two-dimensional RCWA (Rigorous Coupled Wave Analysis) and local absorption
Auer M., Brenner K.-H.
doaj +1 more source
Approaches for the RCWA-based non-destructive characterization of subwavelength-structured gratings [PDF]
EPJ Web of Conferences, 2022 Nano-structuring enables us to add additional degrees of freedom to the design of optical elements. Especially the possibility of controlling the polarization is of great interest in the field of nano-structured optics.
Wüster Julian +4 more
doaj +1 more source
Fourier ellipsometry – an ellipsometric approach to Fourier scatterometry [PDF]
Journal of the European Optical Society-Rapid Publications, 2015 An extension of Fourier scatterometry is presented, aiming at increasing the sensitivity by measuring the phase difference between the reflections polarized parallel and perpendicular to the plane of incidence.
Petrik P. +7 more
doaj +1 more source
Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning [PDF]
Journal of the European Optical Society-Rapid Publications, 2013 Non-interferometric phase retrieval from the intensity measurements in Coherent Fourier Scatterometry (CFS) is presented using a scanning focused spot.
Kumar N. +4 more
doaj +1 more source
Nanomaterials, 2022 Mueller matrix ellipsometry (MME) is a powerful metrology tool for nanomanufacturing. The application of MME necessitates electromagnetic computations for inverse problems of metrology determination in both the conventional optimization process and the ...
Hoang-Lam Pham +4 more
doaj +1 more source
edmundsj/rcwa: Beta Release v0.1.125
, 2022 Features Implements 1D Transfer Matrix Method for homogenous layers Implements full rectangular 2D RCWA for periodic layers Huge material database for n/k values in optical range built-in based on refractiveindex.info, including metals, plastics, glass,
Jordan Edmunds, actions-user
core +1 more source
Implementation and Verification of RCWA Model
, 2018 An RCWA Matlab simulation was developed to guide future designs of phase plates for VCSELs. We will discuss the verification process to validate our current model.
Gish Allouche, Genevieve
core +4 more sources
IEEE Access, 2020 Based on the first-order Taylor expansion, an efficient Rigorous Coupled-Wave Analysis (RCWA) for one-dimensional ultrathin periodic structures is proposed in this paper.
Jie Li +8 more
doaj +1 more source
Two‐dimensional synthetic aperture imaging of targets behind reinforced concrete walls
IET Radar, Sonar & Navigation, 2022 Synthetic aperture imaging of targets closely behind a reinforced concrete wall, modelled by a periodic structure by using the proper Green's function (GF) of the structure, is studied.
Alireza Ghobadi‐Rad +2 more
doaj +1 more source