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Maps of forest vertical structure for Colombia, a megadiverse country. [PDF]

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Camilo Fagua J, Jantz P, Burns P, Jantz SM, Kilbride JB, Goetz SJ.   +5 more
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Reflection anisotropy spectroscopy

Reports on Progress in Physics, 2005
Reflection anisotropy spectroscopy (RAS) is a non-destructive optical probe of surfaces that is capable of operation within a wide range of environments. In this review we trace the development of RAS from its origins in the 1980s as a probe of semiconductor surfaces and semiconductor growth through to the present where it is emerging as a powerful ...
P Weightman, D S Martin, R J Cole, T Farrell   +3 more
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A rapid reflectance anisotropy spectrometer

Measurement Science and Technology, 2001
A 16 channel reflectance anisotropy (RA) spectrometer capable of simultaneously acquiring reflectance spectra and real and imaginary RA spectra on the 0.1 s time-scale is reported. Its performance was evaluated by monitoring the electrolytic deposition/growth and removal of copper on a gold(110) surface.
P Harrison, T Farrell, A Maunder, C I Smith, P Weightman   +4 more
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Azimuth-dependent reflection anisotropy spectroscopy

Journal of Applied Physics, 2003
A detailed explanation of “azimuth dependent reflection anisotropy spectroscopy” (ADRAS) [B. F. Macdonald and R. J. Cole, Appl. Phys. Lett. 80, 3527 (2002)] is presented. Experimental data and simulations are used to illustrate the greater information content of ADRAS compared to the standard reflection anisotropy technique. The application of ADRAS to
B. F. Macdonald, J. S. Law, R. J. Cole
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DIFFERENTIAL-REFLECTANCE SPECTROSCOPY AND REFLECTANCE-ANISOTROPY SPECTROSCOPY ON SEMICONDUCTOR SURFACES

Surface Review and Letters, 1999
The development and the state of the art of surface methods based on the reflection of light are briefly reviewed. A short account is given of the main experimental and theoretical results obtained on semiconductor surfaces over about three decades.
CHIARADIA, PIETRO, DEL SOLE, RODOLFO
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Data reduction for spatially resolved reflectance anisotropy spectrometer

Review of Scientific Instruments, 2023
We show that in spatially resolved reflectance anisotropy (RA) spectrometers, off-axis optical rays introduce a spurious signal component that cannot be addressed by optical alignment. Such a component is associated with the difference between the reflectivities s and p of the sample and depends, in a complex manner, on the incidence position of the ...
L. Rodríguez-Salas, A. Lastras-Martínez, O. F. Núñez-Olvera, M. A. Lastras-Montaño, R. Castro-García, R. E. Balderas-Navarro, L. F. Lastras-Martínez   +6 more
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Real-time reflectance anisotropy spectroscopy of GaAs homoepitaxy

Applied Optics, 2020
Reflectance anisotropy spectroscopy (RAS) is a highly sensitive optical probe for the real-time study of the epitaxial growth of zincblende semiconductors. Here we report on (1) non-equilibrium RAS spectra acquired in real time during the homoepitaxial growth of GaAs, and (2) RAS spectra for GaAs surfaces under equilibrium with several arsenic ...
A, Lastras-Martínez, L E, Guevara-Macías, J G, Santiago-García, J, Ortega-Gallegos, I A, Ruiz-Alvarado, R, Martínez-Espinosa, D, Ariza-Flores, R, Castro-García, R E, López-Estopier, R E, Balderas-Navarro, L F, Lastras-Martínez   +10 more
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Separation of optical anisotropies by angular dependent reflection anisotropy spectroscopy

Applied Physics Letters, 2002
Double rubbing of polymer films, which finds applications in modern liquid crystal devices, has been investigated using reflection anisotropy spectroscopy (RAS) and atomic force microscopy. A method of gauging the relative strength of rubbing in two different directions, based upon the dependence of observed RAS signals on the sample azimuthal angle ...
B. F. Macdonald, R. J. Cole
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Infrared reflectance anisotropy of wurzite GaN

Journal of Applied Physics, 2009
We have measured the infrared reflectance anisotropy of bulk wurzite (0001) GaN. Reflectance difference (RD) spectra have been determined from the experimental reflectance for light polarization along the sample axes [01¯10] and [112¯0]. The spectra show an optical anisotropy around the frequency of the E1(LO) and A1(LO) GaN phonons.
M. C. Rodríguez-Aranda, A. G. Rodríguez, H. Navarro-Contreras, M. A. Vidal   +3 more
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Ellipsoid estimation in coal reflectance anisotropy

Mathematical Geology, 1997
The procedure of fitting an ellipsoid to vitrinite reflectance anisotropy is described. Several authors on this subject use incorrect fitting formulae. The correct formulae are given and a least- squares procedure is developed to give confidence regions for the principal reflectances and their orientations.
Douglas Kelker, Willem Langenberg
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