Chiral Porphyrin Assemblies Investigated by a Modified Reflectance Anisotropy Spectroscopy Spectrometer [PDF]
Reflectance anisotropy spectroscopy (RAS) has been largely used to investigate organic compounds: Langmuir–Blodgett and Langmuir–Schaeffer layers, the organic molecular beam epitaxy growth in situ and in real time, thin and ultrathin organic films ...
Ilaria Tomei +10 more
doaj +7 more sources
Review: An Optical Surface Probe by Reflectance Anisotropy Spectroscopy [PDF]
Rface and interface information. RAS measures the difference in reflectance of light eflectance anisotropy spectroscopy RAS is an optical technique to produce surlinearly polarised along two orthogonal axes in the surface at near normal incidence as ...
Orhan Zeybek
doaj +6 more sources
Precise in situ etch depth control of multilayered III−V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment [PDF]
Reflectance anisotropy spectroscopy (RAS) equipment is applied to monitor dry-etch processes (here specifically reactive ion etching (RIE)) of monocrystalline multilayered III–V semiconductors in situ. The related accuracy of etch depth control is better
Ann-Kathrin Kleinschmidt +7 more
doaj +3 more sources
Doped or Quantum-Dot Layers as In Situ Etch-Stop Indicators for III/V Semiconductor Reactive Ion Etching (RIE) Using Reflectance Anisotropy Spectroscopy (RAS) [PDF]
Reflectance anisotropy spectroscopy (RAS), which was originally invented to monitor epitaxial growth, can—as we have previously shown—also be used to monitor the reactive ion etching of III/V semiconductor samples in situ and in real time, as long as the
Guilherme Sombrio +5 more
doaj +2 more sources
In Situ Studies on the Influence of Surface Symmetry on the Growth of MoSe2 Monolayer on Sapphire Using Reflectance Anisotropy Spectroscopy and Differential Reflectance Spectroscopy [PDF]
The surface symmetry of the substrate plays an important role in the epitaxial high-quality growth of 2D materials; however, in-depth and in situ studies on these materials during growth are still limited due to the lack of effective in situ monitoring ...
Yufeng Huang +6 more
doaj +2 more sources
In Situ Optical Monitoring and Morphological Evolution of Si Nanowires Grown on Faceted Al2O3(0001) Substrates [PDF]
This paper presents the growth and in situ optical characterization of silicon nanowires (Si NWs) on Al2O3(0001) substrates that are thermally faceted using the atomic low angle shadowing technique (ATLAS) method. Annealing Al2O3 substrates in air before
Olzat Toktarbaiuly +6 more
doaj +2 more sources
Polarized optical contrast spectroscopy of in plane anisotropic van der Waals materials [PDF]
Polarized optical contrast spectroscopy is a simple and non-destructive approach to characterize the crystalline anisotropy and orientation of two-dimensional materials.
Ernst Knöckl +3 more
doaj +2 more sources
Optical anisotropy of pristine and reduced V2O5(010) [PDF]
The optical anisotropy of pristine and reduced single crystalline (010) orientated $$\hbox {V}_{2}\hbox {O}_{5}$$ is presented. The reduction of $$\hbox {V}_{2}\hbox {O}_{5}$$ is complex due to the abundance of V-O phases, strong dependence on the ...
Brian Walls +7 more
doaj +2 more sources
Over the last two decades, advancements in airborne imaging spectroscopy have prompted the exploitation of lightweight drones for detailed vegetation assessment at unprecedented resolutions.
Erika Piaser +9 more
doaj +1 more source
Optical Anisotropy of Porphyrin Nanocrystals Modified by the Electrochemical Dissolution
Reflectance anisotropy spectroscopy (RAS) coupled to an electrochemical cell represents a powerful tool to correlate changes in the surface optical anisotropy to changes in the electrochemical currents related to electrochemical reactions.
Rossella Yivlialin +6 more
doaj +1 more source

