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Reflectance anisotropy of silicon surfaces: Discrete dipole calculation
Physical Review B, 1998The reflectivity and reflectance anisotropy (RA) spectra of five silicon surfaces [(001), (113), (112), (111), and (110)] are calculated using the discrete dipole model. The structures used have bulk-terminated surfaces so that RA is found at the optical gap and above. A comparison is made between experimental RA spectra of H-covered (001), (113), and (
Hogan C., Patterson C.
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Anisotropy in the reflectivity measurements of bismuth germanate
Physical Review B, 1986A strong anisotropy in the reflectivity measurements of cubic insulators above the absorption edge is observed for what we believe to be the first time. This observed anisotropy in ${\mathrm{Bi}}_{4}$${\mathrm{Ge}}_{3}$${\mathrm{O}}_{12}$ single crystals is ten times stronger than that observed recently in cubic semiconductors. Experimental results are
, Medrano P, , Meseguer, , Contreras
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The optical anisotropy of Pt(100) studied by reflection anisotropy spectroscopy
Physica Status Solidi (a), 1995The optical anisotropy of the Pt(100) hex-R0.7° reconstructed phase is studied with reflection anisotropy spectroscopy. The transition from the hex-R0.7° to the Pt(1 x 1) structure is also studied. The spectrum of Pt(100) hex-R0.7° is found to be dominated by surface polariton-like absorption due to the wavy nature of the first layer superstructure ...
A. Borg +4 more
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Sum rules in surface differential reflectivity and reflectance anisotropy spectroscopies
Applied Surface Science, 2001Abstract The sum rule for the imaginary part of the dielectric function e″ can help in discriminating surface and bulk-related optical transitions, by means of the number of electrons taking part in the transitions. This is particularly simple in the region below the main critical points of the bulk band structure (below 3.5 eV for Si, below 2.2 eV ...
G Chiarotti +3 more
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CdTe reflection anisotropy line shape fitting
Materials Science and Engineering: B, 2010Abstract In this paper, an empirical novel plane-wave time dependent ensemble is introduced to fit the RA, the reflectance ( R ) and the imaginary part of the dielectric function oscillation measured around the E 1 and E 1 + Δ 1 transition region in II–VI semiconductors.
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Origin of optical anisotropy in reflectance anisotropy spectroscopy of semiconductor surfaces
SPIE Proceedings, 2006The optical anisotropy of a semiconductor surface can have different origins, such as, local-field effects, the electro-optics effect, reconstruction, surface dislocations, and surface roughness. A comprehensive, quantitative picture on how these effects are related to surface optical anisotropies (SOA) can now be obtained thanks to the progress in the
R. A. Vázquez-Nava +2 more
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Journal of Physics D: Applied Physics, 2003
The optical properties of polycrystalline copper subjected to tensile stress are monitored in situ and in real time using reflection anisotropy spectroscopy (RAS). It is shown that RAS allows investigation of the plastic regime. Here, in contrast to the Hooke's law regime, the stress-induced RAS lineshape is found to be dependent on the applied stress.
R J Cole +6 more
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The optical properties of polycrystalline copper subjected to tensile stress are monitored in situ and in real time using reflection anisotropy spectroscopy (RAS). It is shown that RAS allows investigation of the plastic regime. Here, in contrast to the Hooke's law regime, the stress-induced RAS lineshape is found to be dependent on the applied stress.
R J Cole +6 more
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Reflectance anisotropy spectra of CdTe(001) surfaces
physica status solidi (b), 2010AbstractWe present first‐principles calculations of reflectance anisotropy spectra (RAS) of the more common CdTe(001) surface reconstructions: Te‐terminated $(2 \times 1)$ and Cd‐terminated $(2 \times 1)$ and c$(2 \times 2)$. The last two reconstructions with a Cd coverage of half atomic layers.
R. A. Vázquez‐Nava +2 more
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CALCULATION OF REFLECTANCE ANISOTROPY FOR SEMICONDUCTOR SURFACE EXPLORATION
EPIOPTICS-8, 2005AbstractReflectance anisotropy spectroscopy (RAS) is exquisitely sensitive to probe surfaces, with many potential applications in determining surface geometries or monitoring material growth. Thanks to recent computational and methodological progress it has now become possible to calculate surface optical spectra accurately and with true predictive ...
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2002
Leaf area index (LAI) retrieval from remote sensing is a very active research field. In heterogeneous canopies, simulations with the canopy reflectance model Five-Scale show that nadir view vegetation indices, such as NDVI and Simple Ratio (SR), based on near infrared and red reflectance are more closely related to the gap fraction at the solar zenith ...
S G Leblanc +6 more
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Leaf area index (LAI) retrieval from remote sensing is a very active research field. In heterogeneous canopies, simulations with the canopy reflectance model Five-Scale show that nadir view vegetation indices, such as NDVI and Simple Ratio (SR), based on near infrared and red reflectance are more closely related to the gap fraction at the solar zenith ...
S G Leblanc +6 more
openaire +1 more source