Results 101 to 110 of about 6,842 (203)

Antiunitary Symmetry in Non-Hermitian Dissipative Dynamics and Neutron Scattering. [PDF]

Entropy (Basel)
Deák L.
europepmc   +1 more source

Integrating simultaneous interfacial shear rheology with neutron reflectometry for structural and dynamic analysis of fluid interfacial systems. [PDF]

J Appl Crystallogr
Sánchez-Puga P, Tajuelo J, Carrascosa-Tejedor J, Rubio MÁ, Gutfreund P, Maestro A.   +5 more
europepmc   +1 more source

Ghost-peak-based estimation of modulation amplitude in optical correlation-domain reflectometry. [PDF]

Sci Rep
Motoda K, Mizuno Y.
europepmc   +1 more source

Implementation of a Length Gauge Based on Optical Frequency Domain Reflectometry (OFDR). [PDF]

Sensors (Basel)
Shestakov A, Kambur D, Konstantinov Y, Belokrylov M, Claude D, Shardakov I, Turov A.   +6 more
europepmc   +1 more source

The Effects of Electron-Beam-Radiation-Induced Damage on Single-Crystal Silicon Devices with SiO₂ Surface Passivation in a Nitrogen Atmosphere. [PDF]

Materials (Basel)
Yang Y, Lei Y, Li X, Bing W, Li H, Xiang Y, Peng S.   +6 more
europepmc   +1 more source

Clinical evaluation of a new fully automated biometer integrating optical low-coherence reflectometry and Placido-disk topography. [PDF]

Eye Vis (Lond)
Chen Y, Yang X, Li Z, Tan B, Li K, Savini G, Schiano-Lomoriello D, Zhou X, Lei CS, Huang J.   +9 more
europepmc   +1 more source

Twin-compartment solid-liquid cells for neutron reflectometry. [PDF]

J Appl Crystallogr
Paracini N, Burrall H, Saerbeck T, Gutfreund P, Fragneto G, Clifton LA, Arnold T, Cárdenas M.   +7 more
europepmc   +1 more source

Influence of Hydrogen-Incorporation on the Bulk Electronic Structure and Chemical Bonding in Palladium. [PDF]

Adv Sci (Weinh)
Bannenberg LJ, García-Martínez F, Lömker P, Engel RY, Schlueter C, Schreuders H, Navarathna A, Ratcliff LE, Regoutz A.   +8 more
europepmc   +1 more source

Whey Demineralization: Selective Lactose Concentration by Using Polyelectrolyte Multilayer Hollow Fiber Nanofiltration Membranes. [PDF]

Ind Eng Chem Res
Zengin H, Achterhuis I, Razi Parjikolaei B, Ottosen N, de Vos WM.   +4 more
europepmc   +1 more source

White-light colorimetric interferometry for measurement of thickness and topography on semiconductor structures. [PDF]

Sci Rep
Im J, Lee H, Jang K, Choi S.
europepmc   +1 more source