Results 181 to 190 of about 21,421 (244)

High-Efficiency Fiber Edge Coupling for Silicon Nitride Integrated Photonics. [PDF]

open access: yesMicromachines (Basel)
Avdeev SS   +14 more
europepmc   +1 more source

Tantalum-Hafnium: Optical Hydrogen Sensing Materials for High-Temperature Applications. [PDF]

open access: yesACS Appl Mater Interfaces
van Ogtrop I   +4 more
europepmc   +1 more source

Reflectometric-based sensor arrays for the screening of kinase-inhibitor interactions and kinetic determination. [PDF]

open access: yesAnal Bioanal Chem
Wurster V   +13 more
europepmc   +1 more source

Combining multiplexed gate-based readout and isolated CMOS quantum dot arrays. [PDF]

open access: yesNat Commun
Hamonic P   +17 more
europepmc   +1 more source

Broadband Reflectometry for Diagnostics and Monitoring Applications

open access: yesIEEE Sensors Journal, 2011
Reflectometry is a powerful technique that can be effectively employed for a number of practical applications; in particular, the high versatility, the real-time response, and the potential for practical implementation have contributed to the success of ...
Andrea Cataldo, Egidio De Benedetto
exaly   +2 more sources

Microwave reflectometry for magnetically confined plasmas [PDF]

open access: yesReview of Scientific Instruments, 1998
This paper is about microwave reflectometry -- a radar technique for plasma density measurements using the reflection of electromagnetic waves by a plasma cutoff.
Mazzucato E
exaly   +2 more sources

Multicarrier reflectometry [PDF]

open access: yesIEEE Sensors Journal, 2006
journal articleA new reflectometry method called multicarrier reflectometry (MCR) for fault location in cables is proposed. MCR combines a weighted set of sinusoidal excitations into a signal that is sent down the wire.
S. Naik   +2 more
openaire   +2 more sources
Some of the next articles are maybe not open access.

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Imaging reflectometry in situ

Applied Optics, 2007
An innovative method of in situ real-time optical monitoring of thin film deposition and etching is presented. In this technique, intensity maps of a thin film corresponding to a series of wavelengths selected by a monochromator (300-800 nm) are recorded by a CCD camera.
Michal, Urbánek   +3 more
openaire   +2 more sources

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