Results 181 to 190 of about 26,972 (241)
Nanoparticles as Sacrificial Pore Fillers for the Fabrication of High-Permeability Polyelectrolyte Multilayer Membranes. [PDF]
ACS Appl Nano MaterAndrade JR +4 more
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Structure and composition of supported lipid bilayers: a comparison between solvent-assisted lipid bilayer and vesicle fusion methods. [PDF]
J Appl CrystallogrFelderer B +6 more
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Normalography: A Novel Imaging Technique for Visualizing Pixel-Wise Surface Normal Distributions. [PDF]
Sensors (Basel)Inoue S, Igarashi Y, Suzuki S.
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Broadband Reflectometry for Diagnostics and Monitoring Applications
IEEE Sensors Journal, 2011 Reflectometry is a powerful technique that can be effectively employed for a number of practical applications; in particular, the high versatility, the real-time response, and the potential for practical implementation have contributed to the success of ...
Andrea Cataldo, Egidio De Benedetto
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2008
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although the process can be streamlined using cameras, projectors and clever catadioptrics, it generally requires complex infrastructure.
Fabiano Romeiro +2 more
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Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although the process can be streamlined using cameras, projectors and clever catadioptrics, it generally requires complex infrastructure.
Fabiano Romeiro +2 more
openaire +1 more source
Submillimeter optical reflectometry
Journal of Lightwave Technology, 1989The development of optical reflectometers with a spatial resolution in the submillimeter range is reviewed. Optical time-domain reflectometers (OTDRs) and optical low-coherence reflectometers (OLCRs) for nondestructive diagnostics of waveguide devices are discussed.
Gilgen, H. H. +4 more
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Multicarrier Reflectometry [PDF]
IEEE Sensors Journal, 2006 journal articleA new reflectometry method called multicarrier reflectometry (MCR) for fault location in cables is proposed. MCR combines a weighted set of sinusoidal excitations into a signal that is sent down the wire.
Naik, Suketu; Farhang-Boroujeny, Behrouz +1 more
exaly +1 more source
Applied Optics, 2007
An innovative method of in situ real-time optical monitoring of thin film deposition and etching is presented. In this technique, intensity maps of a thin film corresponding to a series of wavelengths selected by a monochromator (300-800 nm) are recorded by a CCD camera.
Michal, Urbánek +3 more
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An innovative method of in situ real-time optical monitoring of thin film deposition and etching is presented. In this technique, intensity maps of a thin film corresponding to a series of wavelengths selected by a monochromator (300-800 nm) are recorded by a CCD camera.
Michal, Urbánek +3 more
openaire +2 more sources
Refractometry by reflectometry
SPIE Proceedings, 1995Complex refractive index determination (refractometry) of metals can be made successfully with methods using reflectivity measurements. In this paper a brief classification of reflectivity methods with subsequent comments about their sensitivity is made. Experimental results obtained using the most suitable methods are presented.
Dan Apostol +5 more
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