Results 231 to 240 of about 53,100 (266)
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Applied Optics, 2007
An innovative method of in situ real-time optical monitoring of thin film deposition and etching is presented. In this technique, intensity maps of a thin film corresponding to a series of wavelengths selected by a monochromator (300-800 nm) are recorded by a CCD camera.
Michal, Urbánek +3 more
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An innovative method of in situ real-time optical monitoring of thin film deposition and etching is presented. In this technique, intensity maps of a thin film corresponding to a series of wavelengths selected by a monochromator (300-800 nm) are recorded by a CCD camera.
Michal, Urbánek +3 more
openaire +2 more sources
Subpicosecond-time-domain reflectometry
Optics Letters, 1981We demonstrate a new method of optical time-domain reflectometry using subpicosecond pulses and nonlinear detection. The high-spatial-resolution ( approximately 15-microm) temporal resolution and sensitivity put new limits on the size and nature of defects that can be detected, localized, and analyzed in optical fibers.
J J, Fontaine +3 more
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Submillimeter optical reflectometry
Journal of Lightwave Technology, 1989The development of optical reflectometers with a spatial resolution in the submillimeter range is reviewed. Optical time-domain reflectometers (OTDRs) and optical low-coherence reflectometers (OLCRs) for nondestructive diagnostics of waveguide devices are discussed.
H.H. Gilgen +4 more
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2009
Abstract Neutron reflectometry, in which neutrons are reflected from planar structures, is a powerful method for investigating properties of interfaces. It is one of the neutron techniques in most demand today and neutron reflectometers are amongst the first instruments to be commissioned at the new pulsed sources SNS and J-PARC.
B T M Willis, C J Carlile
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Abstract Neutron reflectometry, in which neutrons are reflected from planar structures, is a powerful method for investigating properties of interfaces. It is one of the neutron techniques in most demand today and neutron reflectometers are amongst the first instruments to be commissioned at the new pulsed sources SNS and J-PARC.
B T M Willis, C J Carlile
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Refractometry by reflectometry
SPIE Proceedings, 1995Complex refractive index determination (refractometry) of metals can be made successfully with methods using reflectivity measurements. In this paper a brief classification of reflectivity methods with subsequent comments about their sensitivity is made. Experimental results obtained using the most suitable methods are presented.
Dan Apostol +5 more
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2017
Bevölkerungswachstum und Klimawandel haben tiefgreifende Veränderungen im Mekong Delta verursacht. Eine dieser Veränderungen betrifft das zunehmende Auftreten extremer Hochwasserereignisse. Um das Leben der Menschen in den Küstenbereichen des Deltas während solcher Ereignisse zu schützen, ist es von großer Bedeutung, die Wasserstandhöhe in diesen ...
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Bevölkerungswachstum und Klimawandel haben tiefgreifende Veränderungen im Mekong Delta verursacht. Eine dieser Veränderungen betrifft das zunehmende Auftreten extremer Hochwasserereignisse. Um das Leben der Menschen in den Küstenbereichen des Deltas während solcher Ereignisse zu schützen, ist es von großer Bedeutung, die Wasserstandhöhe in diesen ...
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2008
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although the process can be streamlined using cameras, projectors and clever catadioptrics, it generally requires complex infrastructure.
Fabiano Romeiro +2 more
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Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although the process can be streamlined using cameras, projectors and clever catadioptrics, it generally requires complex infrastructure.
Fabiano Romeiro +2 more
openaire +1 more source
Broadband Reflectometry: Theoretical Background
2011In this chapter, the basic approaches of broadband microwave reflectometry are described in detail. More specifically, time domain reflectometry (TDR) and frequency domain reflectometry (FDR) are presented and the involved instrumentation is fully described.
CATALDO, Andrea Maria +2 more
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