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2014
Neutron (and X-ray) reflectometry constitute complementary interfacially sensitive techniques that open access to studying the structure within thin films of both soft and hard condensed matter. Film thickness starts oxide surfaces on bulk substrates, proceeding to (pauci-)molecular layers and up to hundreds of nanometers. Thickness resolution for flat
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Neutron (and X-ray) reflectometry constitute complementary interfacially sensitive techniques that open access to studying the structure within thin films of both soft and hard condensed matter. Film thickness starts oxide surfaces on bulk substrates, proceeding to (pauci-)molecular layers and up to hundreds of nanometers. Thickness resolution for flat
openaire +1 more source