Results 231 to 240 of about 24,260,019 (288)
Deep learning-based framework for time-dependent reliability analysis of a cable-stayed bridge with corroded PSC box girders under gravity loads. [PDF]
Kim J, Kim J, Kim T.
europepmc +1 more source
Robust estimation of the three parameter Weibull distribution for addressing outliers in reliability analysis. [PDF]
Safari MAM +3 more
europepmc +1 more source
Evaluation of Douyin Short Videos on Mammography in China: Quality and Reliability Analysis. [PDF]
Yang H +8 more
europepmc +1 more source
Seismic reliability analysis of reinforced slope considering soil parameter dependence structure. [PDF]
Qie X, Li X, Tao X, Xu S, Huang L.
europepmc +1 more source
Research on the connectivity reliability analysis and optimization of natural gas pipeline network based on topology. [PDF]
Yang X, Chen K, Liu M.
europepmc +1 more source
Some of the next articles are maybe not open access.
Data and materials used in Reliability analysis of Rabindrik Value Orientation Questionnaire Using ICC.
Stephen M. Croucher +2 more
+6 more sources
Stephen M. Croucher +2 more
+6 more sources
Hybrid Reliability Analysis Framework for Reliability Analysis of Tunnels
Journal of Computing in Civil Engineering, 2018AbstractNumerical modelling of tunnels, generally carried out by using some numerical analysis tools [e.g., finite element (FE) method, discrete element method], is often computationally expensive....
Souvik Chakraborty, Dipaloke Majumder
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Matroids and a Reliability Analysis Problem
Mathematics of Operations Research, 1979We present an algorithm for the reliability analysis problem of determining the probability that a stochastic binary system operates. The stochastic binary system is viewed as an independence system. The algorithm finds a partition of the set of independence sets into subsets called intervals.
Michael O. Ball, George L. Nemhauser
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2020
As the integration of components are increasing from VLSI to ULSI level. This may lead to damage of electronic system because each component has its own operating characteristics and conditions. So, health prognostic techniques are used that comprise a deep insight into failure cause and effects of all the components individually as well as an ...
Jérôme Morio +2 more
openaire +2 more sources
As the integration of components are increasing from VLSI to ULSI level. This may lead to damage of electronic system because each component has its own operating characteristics and conditions. So, health prognostic techniques are used that comprise a deep insight into failure cause and effects of all the components individually as well as an ...
Jérôme Morio +2 more
openaire +2 more sources

