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Statistical inference in reliability and life testing problems
2021This thesis was scanned from the print manuscript for digital preservation and is copyright the author. Researchers can access this thesis by asking their local university, institution or public library to make a request on their behalf. Monash staff and postgraduate students can use the link in the References field.
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Reliability of Discrete Modfets: Life Testing, Radiation Effects, and ESD
26th International Reliability Physics Symposium, 1988Experimental and theoretical results of a reliability study of GaAs/AlGaAs MODFETs are presented and show a commonality of degradation modes under various accelerated stress conditions. The reliability of submicron-gate low-noise MODFETs was evaluated using high-temperature storage and DC operating life tests; significantly greater drain current ...
W.T. Anderson +8 more
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Reliability, Life Testing, and Shelf Life
2016Everything will fail, eventually. Reliability is a probability that a system (or a component) will fail no sooner than t time units from the time it begins operating. Reliability has many manifestations, or one might consider reliability as a special case of probabilities that some specific type of event will occur no sooner than t units from some ...
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Ion Propulsion Flight Experience, Life Tests, and Reliability Estimates
Journal of Spacecraft and Rockets, 1973The application of low-thrust ion propulsion systems to space missions requires long duration (~ 5,000-20,000 hr) component operation. Thus, components must be developed with wearout mean times to failure in excess of these required mission times. Furthermore, chance failures which occur during the useful life of components must be minimized.
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Life Testing and Reliability Estimation under Asymmetric Loss
1992In this paper the problem of estimating reliability functions (survival functions) is considered. A survey of some recent results using both asymmetric loss and squared-error loss is presented assuming an underlying negative exponential survival model. For illustration purposes, conjugate families of prior distributions are used.
A. P. Basu +2 more
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Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055), 2002
Accelerated reliability stress tests were performed to evaluate a design concern on a printed circuit board assembly (PCBA) for a disk drive product. Preliminary design tests indicated that a motor driver 176 pin PQFP (plastic quad flat package) IC package mounted on the PCBA may have a reliability problem in the field. The function of the motor driver
S. Jawaid, J. Ferguson
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Accelerated reliability stress tests were performed to evaluate a design concern on a printed circuit board assembly (PCBA) for a disk drive product. Preliminary design tests indicated that a motor driver 176 pin PQFP (plastic quad flat package) IC package mounted on the PCBA may have a reliability problem in the field. The function of the motor driver
S. Jawaid, J. Ferguson
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Multivariate Distributions in Reliability Theory and Life Testing
1981Multivariate parametric distributions which are of interest in reliability theory and life testing are discussed. These include distributions with exponential, Weibull and gamma univariate marginal distributions. Other distributions of interest are the multivariate nonparametric distributions whose marginals have increasing failure rates (IFR ...
Henry W. Block, Thomas H. Savits
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Implantable electrical feedthrough reliability demonstration testing and life prediction
2012 IEEE International Reliability Physics Symposium (IRPS), 2012An accelerated life test has been developed for rapidly evaluation of implantable medical device feedthrough (FT) hermeticity performance. The accelerated test allows for process and/or design optimization in order maximize characterize the hermeticity longevity in a relative short period of time.
Zhi Fang, Andy Thom, Lea Nygren
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Reliability Predictions Using Probabilistic Methods and Key Life Testing
SAE Technical Paper Series, 1997<div class="htmlview paragraph">A Key Life Test is an accelerated test designed to detect a major component failure mode. The Key Life Test process will be outlined, as applied to predicting the life and reliability of an automotive synchronous timing belt.
Ronald H. Salzman, Scott L. Ciemniecki
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