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Assembly reliability evaluation method (AREM)
Proceedings of the 2001 IEEE International Symposium on Assembly and Task Planning (ISATP2001). Assembly and Disassembly in the Twenty-first Century. (Cat. No.01TH8560), 2002Abstract This paper proposes a new design system for assembly quality evaluation called AREM. It is based on the assembly fault occurrence model reflecting both product design and assembly shops. It prevents faults in assembly shops related to the design of the product. The system has three distinctive features: estimation of faults caused by design,
Tatsuya Suzuki +3 more
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Interrater Reliability of Videofluoroscopic Swallow Evaluation
Dysphagia, 2003The past two decades have brought an enormous widening of interest in and knowledge about swallowing disorders. The most frequently used technique for swallow evaluation is X-ray videofluoroscopy. Most interventions are based on this examination. Only a few studies assessing interobserver reliability of videofluoroscopy have been published.
Stoeckli, S J +3 more
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System Reliability Evaluation Under Dynamic Operating Conditions
IEEE Transactions on Reliability, 2019Components in a system work under the same dynamic operating conditions, and their lifetimes are generally positively correlated. Ignorance of the correlation may lead to a significant bias in the evaluation of system reliability.
Lanqing Hong +3 more
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Reliability of Image Evaluation Techniques
Applied Optics, 1969A carefully controlled experiment was conducted to compare the modulation transfer function measurements, for a high performance photographic system, obtained with an automated edge gradient analysis technique and with a semimanual sine wave analysis procedure. These results and other experimentation have determined that image evaluation techniques can
R A, Jones, J T, Kelly
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Fault Incidence Matrix Based Reliability Evaluation Method for Complex Distribution System
IEEE Transactions on Power Systems, 2018A fast reliability calculation method based on the fault incidence matrix (FIM) for the complex distribution system is proposed in this paper. First, the M-segment-N-tie-switch (MSNT) reliability calculation unit for the complex distribution network is ...
Chengshan Wang +4 more
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Transmission station reliability evaluation
IEEE Transactions on Power Systems, 1994Reliability evaluations of transmission stations are necessary in the planning and re-configuration studies of transmission switching stations. This paper describes enhanced station component models which can be used to evaluate station configuration alternatives including those equipped with motor operated air break switches (MOABs).
T.K.P. Medicherla +3 more
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Reliability Engineering & System Safety, 2018
In this paper, the reliability evaluation problem for k-out-of-n: G phased-mission systems with imperfect fault coverage is studied. The system is composed of n identical components, and the mission consists of multiple, consecutive, and non-overlapping ...
G. Wang, R. Peng, L. Xing
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In this paper, the reliability evaluation problem for k-out-of-n: G phased-mission systems with imperfect fault coverage is studied. The system is composed of n identical components, and the mission consists of multiple, consecutive, and non-overlapping ...
G. Wang, R. Peng, L. Xing
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Reliability evaluation of demand-based warm standby systems with capacity storage
Reliability Engineering & System Safety, 2022Heping Jia +5 more
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Evidence reasoning for temporal uncertain information based on relative reliability evaluation
Expert systems with applications, 2018As an important tool for information fusion, evidence theory has been widely applied in many areas. Unlike spatial evidence combination, temporal evidence combination is sequential and dynamic, which calls for new temporal evidence combination rule.
Chengli Fan +4 more
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Interlevel Insulation Reliability Evaluation
IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1981A test vehicle has been developed to monitor the reliability of interlevel insulator layers. It is an all test site wafer and is processed through all the semiconductor personalization steps. It becomes a representative part of a job or lot from which reliability data can be accumulated and projected.
J. Gajda, G. Lindstrom, D. DeLorenzo
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