Ultrasensitive detection of carbendazim pesticide in tea leaves using a green Ag/CuO(Cu<sub>2</sub>O) nanocomposite-based SERS sensor: role of metal/semiconductor transition in sensing performance. [PDF]
Thi Linh D +5 more
europepmc +1 more source
through fluorine chemistry...new dimensions in electronics: HOW HF IMPROVES SEMICONDUCTOR RELIABILITY [PDF]
openalex +1 more source
Ice Lithography: Recent Progress Opens a New Frontier of Opportunities
This review focuses on recent advancements in ice lithography, including breakthroughs in compatible precursors and substrates, processes and applications, hardware, and digital methods. Moreover, it offers a roadmap to uncover innovation opportunities for ice lithography in fields such as biological, nanoengineering and microsystems, biophysics and ...
Bingdong Chang +9 more
wiley +1 more source
Impact of proton-beam irradiation on the electrical reliability and performance of LTPS and a-IGZO thin-film transistors. [PDF]
Noh J +8 more
europepmc +1 more source
A UV‐crosslinkable soft anisotropic conductive film (ACF) provides high‐resolution, room‐temperature electrical interfacing. Upon UV exposure, azide crosslinkers within the ACF matrix form covalent bonds with a wide range of C–H‐containing materials, resulting in interfaces that are both mechanically durable and electrically reliable.
Jun Choi +7 more
wiley +1 more source
<i>In Situ</i> Atomic-Scale Investigation of Electromigration Behavior in Cu-Cu Joints at High Current Density. [PDF]
Huang HJ +9 more
europepmc +1 more source
Strain‐Activated Photo‐Dehalogenation Unlocks Low‐Energy One and Two‐Photon 3D Microfabrication
5,14‐NMI‐Cz acts, conversely to its 7,10‐NMI‐Cz(7,10‐'dibromo‐2‐(2,6‐diisopropylphenyl)‐1H‐benzo[lmn]carbazolo[9,1‐bc][2,8]phenanthroline‐1,3(2H)‐dione) counterpart, as modular photoinitiator with panchromatic photoactivity, featuring a weak C–Br bond from geometric strain for efficient Type I & II initiation. These studies demonstrate applicability of
Kacper Piskorz +10 more
wiley +1 more source
Interface Thermal Resistance in Heterostructures of Micro-Nano Power Devices: Current Status and Future Challenges. [PDF]
Shen Y +5 more
europepmc +1 more source

