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A reliability appraisal of semiconductor devices
Proceedings of the IEE - Part B: Electronic and Communication Engineering, 1959The current problems of assessing the reliability of semiconductor devices are discussed, and reference is made to the order of reliability required in typical applications.The evidence from life tests carried out on devices drawn from production lines of transistors and diodes shows how variations in operating conditions and assessment levels affect ...
R. Brewer, W.W.D. Wyatt
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Semiconductor reliability for the next century
Physics World, 1993The electronics industry now routinely produces devices with up to 1000 million transistors on a single semiconductor chip and this VLSI (very-large-scale integration) revolution shows no sign of stopping. As computer memory requirements push VLSI microfabrication technologies to new extremes, the next generation of dynamic random access memory (DRAM ...
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Reliability Issue in Compound Semiconductor Heterojunction Devices
1998The failure mechanisms affecting electron devices based on compound semiconductors are reviewed.
FANTINI, Fausto +8 more
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Reliability of semiconductor devices
1959 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1959openaire +1 more source
Semiconductor reliability—Another field for physicists
The Physics Teacher, 1994Samuel Derman, Wallace T. Anderson
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