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Analysis of Signal Transmission Efficiency in Semiconductor Interconnect and Proposal of Enhanced Structures. [PDF]
Micromachines (Basel)Hong TY, Kim SE, Park JK, Hong SK.
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Microstructural and Mechanical Characterization of Cu/SnAg Pillar Bumps with Ni-Less Surface Finish Utilizing Laser-Assisted Bonding (LAB). [PDF]
Materials (Basel)Han SE +6 more
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Low-frequency noise of MoTe2 transistor: effects on ambipolar carrier transport and CYTOP doping. [PDF]
Discov NanoShin W +5 more
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Pt nanocluster-Fe single atom pairs dual-regulate charge extraction and interfacial reaction for enhanced photoelectric response. [PDF]
Nat CommunChen Y +9 more
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Reliability of semiconductor devices [PDF]
Physics in Technology, 1976 Report on Metallization systems for semiconductor devices, 13 February 1976 Imperial College, London.
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Semiconductor network reliability assessment [PDF]
Proceedings of the IEEE, 1964 The paper discusses the reliability test plan and test results on semiconductor network microelectronic devices. Included in the test plan are reliability programs, life testing, step stress testing, and environmental tests. The failure analysis-corrective action cycle is discussed at length.
J. Adams, W. Workman
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Reliability Of Semiconductor Injection Lasers
SPIE Proceedings, 1987Semiconductor injection lasers are key components in fiber optic communication systems, therefore their reliability is a determining factor in the technical success of these systems. Lasers are subject to several specific degradation mechanisms some of which affect the bulk of the optically active volume of the device, some the mirror facets and some ...
Wolf, H. D., Mettler, K., Lengyel, G.
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