Results 201 to 210 of about 7,063,934 (307)

Enhancing Electrical Impedance Based Deformation Sensing with Dielectric Current Guide

open access: yesAdvanced Electronic Materials, EarlyView.
This work introduces a dielectric‐based field manipulation strategy for electrical impedance tomography in soft robotics. By using silicone as a passive electric field guide, improved deformation sensing accuracy and reduced interference are achieved without embedding conductive components.
Arsen Abdulali   +3 more
wiley   +1 more source

Predictors of Young Students' School Participation During the Early Days of COVID-19 Remote Learning. [PDF]

open access: yesChild Youth Serv Rev
Johnson AD   +4 more
europepmc   +1 more source

Recent Advances in Programmable Metasurfaces and Meta‐Devices

open access: yesAdvanced Electronic Materials, EarlyView.
Programmable metasurfaces enable various novel functionalities by dynamically tuning electromagnetic wavefronts. This article provides a comprehensive review of recent advances in microwave and terahertz programmable metasurfaces, covering electrical, thermal, optical, and mechanical control mechanisms.
Linda Shao   +4 more
wiley   +1 more source

Analog Weight Update Rule in Ferroelectric Hafnia, Using picoJoule Programming Pulses

open access: yesAdvanced Electronic Materials, EarlyView.
Resistive, ferroelectric synaptic weights based on BEOL‐compatible hafnia/zirconia nanolaminates are fabricated. Lateral downscaling the devices below 10 µm2 enables 20 ns programming with electrical pulses, dissipating ≤ 3 pJ. Experimental results show that final conductance state is set by pulse amplitude, and is largely independent of the initial ...
Alexandre Baigol   +7 more
wiley   +1 more source

The Influence of Residual Ion Drift During Programming of Chip‐Integrated Nanoscale HfO2‐Based Memristive Devices

open access: yesAdvanced Electronic Materials, EarlyView.
1T1R‐arrays combining filamentary‐type memristors and CMOS transistors offer great potential for energy‐efficient analog hardware accelerators. Here, transient SET analysis of nanoscale HfO2 memristors integrated on 180 nm CMOS wafers is discussed.
Oliver Artner   +11 more
wiley   +1 more source

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