Results 241 to 250 of about 63,949 (298)

A Combined Neutron and Synchrotron X-ray Scattering Study of a MgAl-Layered Double Oxide. [PDF]

Inorg Chem
Yang FZT, Famprikis T, Neuefeind J, Danaie M, Coulthard CT, Chen C, O'Hare D.   +6 more
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Antifluorite-derived Li₇MnN₄: revisiting the crystal structure and catalysis in ammonia decomposition.

Catal Sci Technol
Hojamberdiev M, Larralde AL, Heppke EM, Gómez-Cápiro O, Camayang JCA, Bredow T, Yubuta K, Teshima K, Ahamad TM, Lorent C, Kang L, Kayser Y, Ruland H, DeBeer S, Lerch M.   +14 more
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Characterizing microscopic calcification deposits on acrylic intraocular lenses.

Analyst
Ward CL, Perera SS, Mei Z, Ross BX, De Alwis Goonatilleke M, Ayoubi M, Xiao Y, Ault AP, Westrick JA, Linz TH, Lin X.   +10 more
europepmc   +1 more source

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The Rietveld method

2006
An overview of the Rietveld method of analysing powder diffraction data, in which the crystal structure is refined by fitting the entire profile of the diffraction pattern to a calculated profile, is provided. The basic theory of Rietveld refinement is described and some problems that may lead to failure of the method are discussed.
A. Albinati, B. T. M. Willis
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The Rietveld method

Physica Scripta, 2014
A summary is given of the development of an improved method to handle powder diffraction data. The resulting method, now called the Rietveld method, uses powder diffraction step-scanned intensities instead of integrated powder intensities. This enables the full use of the information content of a powder diagram.
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Quantitative phase analysis using the Rietveld method

Journal of Applied Crystallography, 1988
Quantitative phase analysis of multicomponent mixtures using X-ray powder diffraction data has been approached with a modified version of the Rietveld computer program of Wiles & Young [J. Appl. Cryst. (1981), 14, 149–151]. This new method does not require measurement of calibration data nor the use of an internal standard; however, the approximate ...
D. L. Bish, S. A. Howard
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Domain Size Analysis in the Rietveld Method

Materials Science Forum, 2010
The implementation of a physically-sound size broadening model for peak profiles in the Rietveld method is presented. TOPAS macros are provided and the results compared with analogous modelling performed according to advanced analysis methods such as the Whole Powder Pattern Modelling.
W. I. F. David, Leoni, Matteo, Scardi, Paolo   +2 more
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Bayesian approach applied to the Rietveld method

Journal of Applied Crystallography, 2014
The application of the Rietveld method for lattice constant and crystal structure refinement has been undertaken with great success. More routinely, this method is used to estimate quantitative phase amounts and to get information on the coherent diffracting length and the lattice defect density.
Manfred Wiessner, Paul Angerer
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