Results 281 to 290 of about 2,619,148 (295)
Some of the next articles are maybe not open access.

An automatic test pattern generator for minimizing switching activity during scan testing activity

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2002
Seongmoon Wang
exaly  

An Efficient Scan Tree Design for Compact Test Pattern Set

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2007
Bhargab B Bhattacharya   +1 more
exaly  

Scanning patterns in chronic thyroiditis.

Journal of nuclear medicine : official publication, Society of Nuclear Medicine, 1967
J, Franco, N J, Condy, M, Coppler
openaire   +1 more source

PASS: Pattern-Sequence-Authentication–Based Secure Scan against Reverse Engineering Attacks

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Seokjun Jang, Sungho Kang
exaly  

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