Results 61 to 70 of about 63,428 (281)

Optoelectronic Control of Redox Dynamics in POM Memristors for Noise‐Resilient Speech and Hardware‐Level Motion Recognition

Advanced Functional Materials, EarlyView.
Optoelectronic control of redox‐active polyoxometalate clusters in polymer matrices yields hybrid memristors with switchable volatile and non‐volatile modes, enabling reservoir‐type in‐sensor optical preprocessing and stable multilevel synapses for multimodal neuromorphic computing, including noise‐tolerant audiovisual keyword recognition and hardware ...
Xiangyu Ma, Ziyu Lv, Guohua Zhang, Zhongyue Xu, Yongbiao Zhai, Haiming Huang, Qiyan Zhang, Xiaojin Zhao, Yan Wang, Ye Zhou, Ziyu Xiong, Guanglong Ding, Wentao Xu, Su‐Ting Han   +13 more
wiley   +1 more source

Beyond 5 GHz excitation of a ZnO-based high-overtone bulk acoustic resonator on SiC substrate

Scientific Reports, 2023
This work reports on the fabrication and characterization of an Au/ZnO/Pt-based high-overtone bulk acoustic resonator (HBAR) on SiC substrates.
Padmalochan Panda, Soumyadip Chatterjee, Siddharth Tallur, Apurba Laha   +3 more
doaj   +1 more source

High‐Throughput Exfoliation of Optoelectronic‐Grade MoS2 via Turbulent‐Flow Wet Jet Milling

Advanced Functional Materials, EarlyView.
A scalable wet jet milling exfoliation method is demonstrated for producing optoelectronic‐grade MoS2 nanosheets using environmentally friendly ethyl cellulose in ethanol dispersion media. Guided by fluid dynamics modeling, this approach is optimized to achieve record‐high exfoliation throughput and concentration.
Maryam Khalaj, Shreyash S. Hadke, Lindsay E. Chaney, Janan Hui, Thomas Birge, Linda Li, Vinod K. Sangwan, Mark C. Hersam   +7 more
wiley   +1 more source

GAN-Based Super-Resolution in Linear R-SAM Imaging for Enhanced Non-Destructive Semiconductor Measurement

Applied Sciences
The precise identification and non-destructive measurement of structural features and defects in semiconductor wafers are essential for ensuring process integrity and sustaining high yield in advanced manufacturing environments.
Thi Thu Ha Vu, Tan Hung Vo, Trong Nhan Nguyen, Jaeyeop Choi, Le Hai Tran, Vu Hoang Minh Doan, Van Bang Nguyen, Wonjo Lee, Sudip Mondal, Junghwan Oh   +9 more
doaj   +1 more source

Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound

IEEE Access, 2019
Acoustic micro-imaging based on high-frequency ultrasound has been widely and effectively used for microdefect detection in microelectronic packages. With the miniaturization of microelectronic devices and the reduction of defects, edge blurring occurs ...
Lei Su, Xiaonan Yu, Ke Li, Xingyan Yao, Michael Pecht   +4 more
doaj   +1 more source

Simulation Research on Sparse Reconstruction for Defect Signals of Flip Chip Based on High-Frequency Ultrasound

Applied Sciences, 2020
Flip chip technology has been widely used in various fields. As the density of the solder balls in flip chip technology is increasing, the pitch among solder balls is narrowing, and the size effect is more significant. Therefore, the micro defects of the
Xiaonan Yu, Hairun Huang, Wanlong Xie, Jiefei Gu, Ke Li, Lei Su   +5 more
doaj   +1 more source

Unlocking Multi‐Valley Energy Pockets and Interface‐Induced Phonon Filtering in InSb Thermoelectrics by Reaction‐Driven Interface Engineering

Advanced Functional Materials, EarlyView.
InSb, a narrow‐bandgap semiconductor with high carrier mobility, is promising for thermoelectric energy conversion but suffers from high lattice thermal conductivity and strong bipolar conduction. Here, in situ interface engineering using Co2O3 nanoprecursors forms hierarchical CoSbx/In2O3/CoSb3 heterostructures that enhance phonon scattering and ...
Jiwu Xin, Xiao Yang, Xiao‐Lei Shi, Chengyun Xu, Xi Ling, Pengyu Zhang, Jinfeng Dong, Yong Du, Haisheng Chen, Ting Zhang, Zhi‐Gang Chen   +10 more
wiley   +1 more source

Combined phase-sensitive acoustic microscopy and confocal laser scanning microscopy

Ultrasonics, 2006
Combined phase-sensitive acoustic microscopy (PSAM) at 1.2 GHz and confocal laser scanning microscopy (CLSM) in reflection and fluorescence has been implemented and applied to polymer blend films and fluorescently labeled fibroblasts and neuronal cells in order to explore the prospects and the various contrast mechanisms of this powerful technique ...
Kamanyi, Albert, Ngwa, Wilfred, Betz, Timo, Wannemacher, Reinhold, Grill, Wolfgang   +4 more
openaire   +4 more sources

Understanding the Effects of Conductive Polymer Electrode Coating on Recorded Neural Signals

Advanced Healthcare Materials, EarlyView.
Conductive polymer coatings are widely explored to improve the quality of signals recorded with chronically implanted neural electrodes, offering enhanced biocompatibility along with reduced electrode impedance. Combining computational modelling and data from PEDOT:PTS coated and PtIr electrodes in rats, we show that improvements in signal quality with
Karthik Sridhar, Judith Evers, Alexandre Trotier, Manus Biggs, Madeleine M. Lowery   +4 more
wiley   +1 more source

Electronic Scanning in Acoustic Microscopy

, 1990
Scanning acoustic microscopy (SAM) employs mechanical scanning in both x and y directions. There is one great advantage in this configuration which is that imaging is done on axis, resulting in diffraction limited resolution. However a mechanical system is inherently slow and cumbersome, even though recent advances have brought the scanning time for an
Cheeke, J., Germain, L.
openaire   +3 more sources