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A combined scanning tunneling microscope and scanning electron microscope
2009A scanning tunneling microscope (STM) was developed to work in conjunction with a Hitachi S-4100 field emission scanning electron microscope (SEM). To achieve the necessary five degrees of freedom for sample and probe movement, an entirely mechanical method was used, employing pairs of parallelogram flexure hinges actuated by set screws driven through ...
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Objective comparison of scanning ion and scanning electron microscope images
Scanning, 1997Tohru Ishitani
exaly
Comparative study of image contrast in scanning electron microscope and helium ion microscope
Journal of Microscopy, 2017R O'Connell, Hongzhou Zhang, D Fox
exaly
Measurement of the divergence angle of the electron microprobe of a scanning electron microscope
Measurement Techniques, 1996Yu A Novikov, A V Rakov, I Yu Stekolin
exaly
Development of new techniques for scanning electron microscope observation using ionic liquid
Electrochimica Acta, 2008Tsukasa Torimoto, Susumu Kuwabata
exaly

