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A combined scanning tunneling microscope and scanning electron microscope

2009
A scanning tunneling microscope (STM) was developed to work in conjunction with a Hitachi S-4100 field emission scanning electron microscope (SEM). To achieve the necessary five degrees of freedom for sample and probe movement, an entirely mechanical method was used, employing pairs of parallelogram flexure hinges actuated by set screws driven through ...
openaire   +1 more source

Scanning electron microscopes

Metal Finishing, 2003
openaire   +1 more source

Comparative study of image contrast in scanning electron microscope and helium ion microscope

Journal of Microscopy, 2017
R O'Connell, Hongzhou Zhang, D Fox
exaly  

Measurement of the divergence angle of the electron microprobe of a scanning electron microscope

Measurement Techniques, 1996
Yu A Novikov, A V Rakov, I Yu Stekolin
exaly  

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