Results 31 to 40 of about 971,631 (379)

Partial Scanning Transmission Electron Microscopy with Deep Learning [PDF]

open access: yesSci Rep 10, 8332 (2020), 2019
Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a two-stage multiscale generative adversarial neural network to complete realistic 512$\times$512 scanning transmission ...
arxiv   +1 more source

Formation of Three-Way Scanning Electron Microscope Moiré on Micro/Nanostructures

open access: yesThe Scientific World Journal, 2014
Three-way scanning electron microscope (SEM) moiré was first generated using a designed three-way electron beam (EB) in an SEM. The spot-type three-way SEM moiré comes from the interference between the three-way EB and the specimen grating in which the ...
Qinghua Wang   +2 more
doaj   +1 more source

Microleakage of different provisionalization techniques for class I inlays

open access: yesJournal of Dental Sciences, 2013
Background/purpose: To investigate the effects of different provisionalization methods on the microleakage of class I inlay cavities. Materials and methods: Class I inlay cavities were prepared on human molars (n = 60). Teeth were divided into six groups
Selim Erkut   +4 more
doaj   +1 more source

Multiscale correlative tomography: an investigation of creep cavitation in 316 stainless steel [PDF]

open access: yes, 2017
Creep cavitation in an ex-service nuclear steam header Type 316 stainless steel sample is investigated through a multiscale tomography workflow spanning eight orders of magnitude, combining X-ray computed tomography (CT), plasma focused ion beam (FIB ...
A Delobbe   +31 more
core   +2 more sources

Imaging doubled shot noise in a Josephson scanning tunneling microscope [PDF]

open access: yesPhys. Rev. B 100, 104506 (2019), 2019
We have imaged the current noise with atomic resolution in a Josephson scanning tunneling microscope with a Pb-Pb junction. By measuring the current noise as a function of applied bias, we reveal the change from single electron tunneling above the superconducting gap energy to double electron charge transfer below the gap energy when Andreev processes ...
arxiv   +1 more source

Transport Simulations on Scanning Transmission Electron Microscope Images of Nanoporous Shale

open access: yesEnergies, 2020
Digital rock physics is an often-mentioned approach to better understand and model transport processes occurring in tight nanoporous media including the organic and inorganic matrix of shale.
Laura Frouté   +4 more
doaj   +1 more source

A case of trichorrhexis nodosa

open access: yesPifu-xingbing zhenliaoxue zazhi, 2022
We report a case of trichorrhexis nodosa. A 27-year-old female presented with white nodules of hair that were easily broken for 17 years. Dermatological examination showed that the hair was sparse, dry, and there were many tiny granular white nodules ...
Sha XIAO, Tao GAO, Qingchun DIAO
doaj   +1 more source

Examination of mycological samples by means of the scanning electron microscope

open access: yesRevista da Sociedade Brasileira de Medicina Tropical, 1973
Three species of Siphomycetes: Rhizopus arhizus, Rhizopus equinus and Rhizopus nigricans, as well as a Septomycete: Emericella nidulans, have been examined by means of a scanning electron microscope.
M. Thibaut, M. Ansel
doaj   +3 more sources

Scanning electron microscopy image representativeness: morphological data on nanoparticles. [PDF]

open access: yes, 2017
A sample of a nanomaterial contains a distribution of nanoparticles of various shapes and/or sizes. A scanning electron microscopy image of such a sample often captures only a fragment of the morphological variety present in the sample.
Ballard D.H   +14 more
core   +1 more source

The trajectories of secondary electrons in the scanning electron microscope [PDF]

open access: yesScanning, 2006
AbstractThree‐dimensional simulations of the trajectories of secondary electrons (SE) in the scanning electron microscope have been performed for plenty of real configurations of the specimen chamber, including all its basic components. The primary purpose was to evaluate the collection efficiency of the Everhart‐Thornley detector of SE and to reveal ...
Ilona Müllerová, Ivo Konvalina
openaire   +3 more sources

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