Results 31 to 40 of about 1,312,739 (385)
Mechanical scanning of the specimen in the scanning electron microscope [PDF]
Scanning, 2004 AbstractA scanning electron microscope (SEM) system equipped with a motor drive specimen stage fully controlled with a personal computer (PC) has been utilized for obtaining ultralow magnification SEM images. This modern motor drive stage works as a mechanical scanning device.
Makoto Miyamoto, Eisaku Oho
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Partial Scanning Transmission Electron Microscopy with Deep Learning [PDF]
Sci Rep 10, 8332 (2020), 2019 Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a two-stage multiscale generative adversarial neural network to complete realistic 512$\times$512 scanning transmission ...
arxiv +1 more source
Nitrogen implantation with a scanning electron microscope [PDF]
Scientific Reports, 2018 AbstractEstablished techniques for ion implantation rely on technically advanced and costly machines like particle accelerators that only few research groups possess. We report here about a new and surprisingly simple ion implantation method that is based upon a widespread laboratory instrument: The scanning electron microscope.
St. Jankuhn +4 more
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Scanning Electron Microscope: Advantages and Disadvantages in Imaging Components
, 2017 An account of the early history of SEM has been presented by McMullan (1988 and 2006) Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, (Knoll, 1935) it was Manfred von
O. Choudhary, Priyan ka
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Formation of Three-Way Scanning Electron Microscope Moiré on Micro/Nanostructures
The Scientific World Journal, 2014 Three-way scanning electron microscope (SEM) moiré was first generated using a designed three-way electron beam (EB) in an SEM. The spot-type three-way SEM moiré comes from the interference between the three-way EB and the specimen grating in which the ...
Qinghua Wang +2 more
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Microleakage of different provisionalization techniques for class I inlays
Journal of Dental Sciences, 2013 Background/purpose: To investigate the effects of different provisionalization methods on the microleakage of class I inlay cavities. Materials and methods: Class I inlay cavities were prepared on human molars (n = 60). Teeth were divided into six groups
Selim Erkut +4 more
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Nanotip electron gun for the scanning electron microscope [PDF]
Scanning, 2005 Experimental nanotips have shown significant improvement in the resolution performance of a cold field emission scanning electron microscope (SEM). Nanotip electron sources are very sharp electron emitter tips used as a replacement for the conventional tungsten field emission (FE) electron sources.
Zsolt Radi +3 more
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Mapping the potential within a nanoscale undoped GaAs region using a scanning electron microscope [PDF]
Appl. Phys. Lett. Vol 84, pp. 2109-2111, 2004, 2004 Semiconductor dopant profiling using secondary electron imaging in a scanning electron microscope (SEM) has been developed in recent years. In this paper, we show that the mechanism behind it also allows mapping of the electric potential of undoped regions.
arxiv +1 more source
Scanning electron microscope evidence of telocytes in vasculature
Journal of Cellular and Molecular Medicine, 2014 Here, we here present scanning electron microscope data for the existent telocytes (TCs) on the endothelial surface of the wall of pig coronary arteries, internal thoracic arteries and carotid arteries.
Hua Li +4 more
semanticscholar +1 more source
A scanning electron microscope for ultracold atoms [PDF]
Laser Physics Letters, 2006 We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focused electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atom's position.
Herwig Ott +3 more
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