Results 31 to 40 of about 1,519,209 (383)
Scanning Electron Microscope: Advantages and Disadvantages in Imaging Components
An account of the early history of SEM has been presented by McMullan (1988 and 2006) Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, (Knoll, 1935) it was Manfred von
O. Choudhary, Priyan ka
semanticscholar +1 more source
Formation of Three-Way Scanning Electron Microscope Moiré on Micro/Nanostructures
Three-way scanning electron microscope (SEM) moiré was first generated using a designed three-way electron beam (EB) in an SEM. The spot-type three-way SEM moiré comes from the interference between the three-way EB and the specimen grating in which the ...
Qinghua Wang +2 more
doaj +1 more source
Nanotip electron gun for the scanning electron microscope [PDF]
Experimental nanotips have shown significant improvement in the resolution performance of a cold field emission scanning electron microscope (SEM). Nanotip electron sources are very sharp electron emitter tips used as a replacement for the conventional tungsten field emission (FE) electron sources.
Zsolt Radi +3 more
openaire +3 more sources
Multiscale correlative tomography: an investigation of creep cavitation in 316 stainless steel [PDF]
Creep cavitation in an ex-service nuclear steam header Type 316 stainless steel sample is investigated through a multiscale tomography workflow spanning eight orders of magnitude, combining X-ray computed tomography (CT), plasma focused ion beam (FIB ...
A Delobbe +31 more
core +2 more sources
High-resolution, high-throughput imaging with a multibeam scanning electron microscope
Electron–electron interactions and detector bandwidth limit the maximal imaging speed of single‐beam scanning electron microscopes. We use multiple electron beams in a single column and detect secondary electrons in parallel to increase the imaging speed
semanticscholar +1 more source
Microleakage of different provisionalization techniques for class I inlays
Background/purpose: To investigate the effects of different provisionalization methods on the microleakage of class I inlay cavities. Materials and methods: Class I inlay cavities were prepared on human molars (n = 60). Teeth were divided into six groups
Selim Erkut +4 more
doaj +1 more source
Transport Simulations on Scanning Transmission Electron Microscope Images of Nanoporous Shale
Digital rock physics is an often-mentioned approach to better understand and model transport processes occurring in tight nanoporous media including the organic and inorganic matrix of shale.
Laura Frouté +4 more
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Scanning ultrafast electron microscopy [PDF]
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200
Mohammed, Omar F. +2 more
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Examination of mycological samples by means of the scanning electron microscope
Three species of Siphomycetes: Rhizopus arhizus, Rhizopus equinus and Rhizopus nigricans, as well as a Septomycete: Emericella nidulans, have been examined by means of a scanning electron microscope.
M. Thibaut, M. Ansel
doaj +3 more sources
The paper presents the processing, mechanical and sliding wear characterization of particulate filled cement by-pass dust and carbon fiber (fixed) reinforced homogeneous and functionally graded vinyl ester composites.
Gangil Brijesh +2 more
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