Results 251 to 260 of about 503,414 (282)

Experiments with a scanning tunneling microscope (STM) mounted in a scanning electron microscope (SEM)

Proceedings, annual meeting, Electron Microscopy Society of America, 1986
Scanning tunneling microscopes (STM) exist in two versions. In both of these, a pointed metal tip is scanned in close proximity to the specimen surface by means of three piezos. The distance of the tip from the sample is controlled by a feedback system to give a constant tunneling current between the tip and the sample.
Oliver C. Wells, Mark E. Welland
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Analysis of Construction Material Using SEM (Scanning Electron Microscope)

Advanced Materials Research, 2013
This study analyzed change of microstructure of air pollution control (APC) ash after being sintered at 700°C, 900°C and 1100°C using SEM (scanning electronic microscope). It was found that fly ash has a loose structure and lots of pores among the particulates, making it easy for heavy metals to be extracted into the environment.
Hai Ying Zhang, Chuan Yun Wan
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Microdiffraction phase identification in the scanning electron microscope (SEM)

Powder Diffraction, 2004
The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns ...
R. P. Goehner, J. R. Michael
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Scanning Electron Microscope (Sem) Dimensional Measurement Tool

SPIE Proceedings, 1986
Requirements for measurement of very small integrated circuit (IC) device structures have become increasingly more demanding with the advent of electron beam, x-ray and advanced optical lithographic processes. High throughput, highly accurate and repeatable measurement tools are needed to guarantee dimensional control for device performance. This paper
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Newly developed mask observation scanning electron microscope (SEM) JWS-7800

SPIE Proceedings, 1994
Scanning electron microscopes (SEMs) are now coming into use as mask observation, metrology and defect inspection tools. Phase shift masks and X-ray masks are fabricated with several thin membranes on a substrate. In order to get 3D information about the membranes' structure, high tilt observation with high resolution is necessary. This paper describes
Kazuhiro Honda, Hiroshi Shimada, S. Norioka, Tatsuya Matsuo   +3 more
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Scanning Electron Microscopic (SEM) Study

2013
Segnet and Anderson (1971) indicated the nature of changes occurring in the physical structures of a well and a poorly crystallized kaolinite when heated to different temperatures by scanning electron microscopic studies.
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Quantitative Measurement of Electromagnetic Distortions in Scanning Electron Microscope (SEM)

2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, 2007
Image deformations caused by electromagnetic interference (EMI) are ones of the most frequent undesirable effects in practical scanning electron microscopy. They usually appear, even although the place chosen for a microscope system fulfills EMI conditions, as periodic deformation of vertical edges of an observed specimen.
Mariusz Pluska, Lukasz Oskwarek, Remigiusz Rak, Andrzej Czerwinski   +3 more
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Microcharacterization of electroluminescent diodes with the scanning electron microscope (SEM)

IEEE Transactions on Electron Devices, 1975
A complete material characterization of electroluminescent diodes necessarily requires a high spatial resolution because of the micron-sized thickness of the different epitaxial layers. A modified arrangement of a scanning electron microscope (SEM) has proven to be an extremely useful tool for obtaining information on the various parameters of each of ...
L.J. Balk, E. Kubalek, E. Menzel
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Scanning electron microscope (SEM) studies on the epiblast of young chick embryos

Zeitschrift f�r Anatomie und Entwicklungsgeschichte, 1974
The epiblast of young chick embryos of stages 4–8 (Hamburger and Hamilton) was investigated by scanning electron microscopy. On the basis of surface differentiation, two zones can be distinguished.
H J, Jacob, B, Christ, M, Jacob, G J, Bijvank   +3 more
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Scanning electron microscope (SEM) study of mouse embryos obtained from isolated blastomeres

Journal of In Vitro Fertilization and Embryo Transfer, 1991
Preimplantation diagnosis and embryo sexing offer great possibilities in the prevention of human diseases and in the field of animal production. These techniques involve blastomere isolation. Isolated blastomeres can grow in culture and develop as whole embryos.
M, Ponsà, C, Nogués, F, Vidal, J, Egozcue   +3 more
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