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Lingual Papillae in Hamdani Sheep During Foetal Periods: Gross, Scanning Electron Microscopy, Histochemical and Immunohistochemical Analysis. [PDF]
Vet Med SciGüzel BC +3 more
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Application of the scanning electron microscopy in ophthalmic research
Indian Journal of Ophthalmology, 1983 Basu P
doaj
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Histopathology, 1982
The technology of scanning electron microscopy (SEM) is described in brief. Its application to the study of cell and tissue structure is demonstrated and the evolution of the concept of ‘topographical histology’ is discussed. Some current literature on the applications of SEM is reviewed under the headings of experimental pathology and human pathology.
K E, Carr, P G, Toner, K M, Saleh
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The technology of scanning electron microscopy (SEM) is described in brief. Its application to the study of cell and tissue structure is demonstrated and the evolution of the concept of ‘topographical histology’ is discussed. Some current literature on the applications of SEM is reviewed under the headings of experimental pathology and human pathology.
K E, Carr, P G, Toner, K M, Saleh
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Onychoschizia: Scanning electron microscopy
Journal of the American Academy of Dermatology, 1984The distal ends of the fingernails of four women with onychoschizia were studied with scanning electron microscopy. The dorsal surface and tip of each nail showed horizontal lamellar separations representing single cell layers. Some cleavage lines extended proximally into the nail plate, revealing remarkable sculptured cell surfaces deep within the ...
W B, Shelley, E D, Shelley
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Stroboscopic scanning electron microscopy
Journal of Physics E: Scientific Instruments, 1968High frequency cyclic voltages on a specimen surface have been studied pictorially, in the scanning electron microscope, by applying the principle of the sampling oscilloscope. The electron beam in the microscope column is pulsed, and the phase varied with respect to that of the waveform on the specimen.
G S, Plows, W C, Nixon
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Modern Scanning Electron Microscopy. 2. Test Objects for Scanning Electron Microscopy
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2023The review of the test objects intended for calibration of scanning electron microscopes and researches to secondary electronic emission of a relief surface of a solid state in scanning electron microscope is carried out. The test objects are divided on two parameters – kind of a relief and structure of a relief.
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High-resolution scanning electron microscopy
Ultramicroscopy, 1991The scanning electron microscope (SEM) builds up an image by sampling contiguous sub-volumes near the surface of the specimen. A fine electron beam selectively excites each sub-volume and then the intensity of some resulting signal is measured. The spatial resolution of images made using such a process is limited by at least three factors. Two of these
D C, Joy, J B, Pawley
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2017
Volume scanning electron microscopy is renewing interest in electron microscopy by offering three dimensional visualisation of biological systems. Two main contributors to this are the Serial Block-Face SEM (SBEM) and Focused Ion Beam SEM (FIB-SEM).
Richard I. Webb, Nicole L. Schieber
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Volume scanning electron microscopy is renewing interest in electron microscopy by offering three dimensional visualisation of biological systems. Two main contributors to this are the Serial Block-Face SEM (SBEM) and Focused Ion Beam SEM (FIB-SEM).
Richard I. Webb, Nicole L. Schieber
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1994
Since the appearance of the first commercial scanning electron microscope (SEM) three decades ago, major advances were achieved in resolution, new electron probe sources, the development of additional modes, and computerization (including built-in image store capabilities in the current generation of instruments).
B. G. Yacobi, D. B. Holt
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Since the appearance of the first commercial scanning electron microscope (SEM) three decades ago, major advances were achieved in resolution, new electron probe sources, the development of additional modes, and computerization (including built-in image store capabilities in the current generation of instruments).
B. G. Yacobi, D. B. Holt
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