Results 21 to 30 of about 840,881 (357)
Imaging and force transduction in correlative scanning force and confocal fluorescence microscopy
Correlative scanning force and confocal fluorescence microscopy has been used to study individual molecules, nanoparticles and nanoparticle oligomers. By applying a compressive force via the AFM cantilever, spectral blue and red shifts in the range of ...
Basché Thomas
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In situ microscopic investigation of ion migration on the surface of chromium coated steels
Cathodic spreading of electrolyte on two-layers chromium coatings electrodeposited from trivalent chromium electrolyte on steel was studied on the micro- and the macroscale. The behavior is discussed in view of results obtained on electrical conductivity
J. Manoj Prabhakar +2 more
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Methods for Accuracy Increasing of Solid Brittle Materials Fracture Toughness Determining
Method for determining of the fracture toughness of brittle materials by indentation is described. The critical stress intensity factor KIC quantifies the fracture toughness. Methods were developed and applied to improve the accuracy of KIC determination
V. A. Lapitskaya +3 more
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Piezoelectric and ferroelectric materials have garnered significant interest owing to their excellent physical properties and multiple potential applications.
Owoong Kwon +3 more
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Optimal geometry for a quartz multipurpose SPM sensor
We propose a geometry for a piezoelectric SPM sensor that can be used for combined AFM/LFM/STM. The sensor utilises symmetry to provide a lateral mode without the need to excite torsional modes.
Julian Stirling
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The cell membrane is a fundamental biological structure, which is only 6–10 nm thick. It is composed of hundreds of lipid types, which form small and dynamic lipid domains or rafts.
Morgan Robinson +3 more
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Boxcar Averaging Scanning Nonlinear Dielectric Microscopy
Scanning nonlinear dielectric microscopy (SNDM) is a near-field microwave-based scanning probe microscopy method with a wide variety of applications, especially in the fields of dielectrics and semiconductors.
Kohei Yamasue, Yasuo Cho
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Peak Force Infrared - Kelvin Probe Force Microscopy.
Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provides insight into structure-functional relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a
D. Jakob +5 more
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Atomic force microscopy (AFM) was combined with scanning electron microscopy (SEM) to investigate electronic devices. In general, under observation using an optical microscope, it is difficult to position the cantilever at an arbitrary scan area of an ...
Takeshi Uruma +6 more
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At biological interfaces, flexible surface structures and mobile water interact with each other to present non-uniform three-dimensional (3D) distributions. In spite of their impact on biological functions, molecular-scale understanding of such phenomena
H. Asakawa +3 more
semanticscholar +1 more source

